Modeling generalized stacking faults in Au using the tight-binding potential combined with a simulated annealing method

Modeling generalized stacking faults in Au using the tight-binding potential combined with a simulated annealing method

10.1140/epjb/e2002-00197-6

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Bibliographic Details
Main Authors: Cai, J., Wang, J.-S.
Other Authors: COMPUTATIONAL SCIENCE
Format: Article
Published: 2014
Subjects:
61.72.Nn stacking faults and other planar or extended defects
71.15.Nc Total energy and cohesive energy calculations
Online Access:http://scholarbank.nus.edu.sg/handle/10635/104816
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/104816

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