Modeling generalized stacking faults in Au using the tight-binding potential combined with a simulated annealing method
10.1140/epjb/e2002-00197-6
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sg-nus-scholar.10635-1048162023-10-26T20:47:59Z Modeling generalized stacking faults in Au using the tight-binding potential combined with a simulated annealing method Cai, J. Wang, J.-S. COMPUTATIONAL SCIENCE 61.72.Nn stacking faults and other planar or extended defects 71.15.Nc Total energy and cohesive energy calculations 10.1140/epjb/e2002-00197-6 European Physical Journal B 28 1 45-48 2014-10-28T03:12:11Z 2014-10-28T03:12:11Z 2002-07-01 Article Cai, J., Wang, J.-S. (2002-07-01). Modeling generalized stacking faults in Au using the tight-binding potential combined with a simulated annealing method. European Physical Journal B 28 (1) : 45-48. ScholarBank@NUS Repository. https://doi.org/10.1140/epjb/e2002-00197-6 14346028 http://scholarbank.nus.edu.sg/handle/10635/104816 000177679500005 Scopus |
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61.72.Nn stacking faults and other planar or extended defects 71.15.Nc Total energy and cohesive energy calculations |
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61.72.Nn stacking faults and other planar or extended defects 71.15.Nc Total energy and cohesive energy calculations Cai, J. Wang, J.-S. Modeling generalized stacking faults in Au using the tight-binding potential combined with a simulated annealing method |
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10.1140/epjb/e2002-00197-6 |
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COMPUTATIONAL SCIENCE |
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COMPUTATIONAL SCIENCE Cai, J. Wang, J.-S. |
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Article |
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Cai, J. Wang, J.-S. |
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Cai, J. |
title |
Modeling generalized stacking faults in Au using the tight-binding potential combined with a simulated annealing method |
title_short |
Modeling generalized stacking faults in Au using the tight-binding potential combined with a simulated annealing method |
title_full |
Modeling generalized stacking faults in Au using the tight-binding potential combined with a simulated annealing method |
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Modeling generalized stacking faults in Au using the tight-binding potential combined with a simulated annealing method |
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Modeling generalized stacking faults in Au using the tight-binding potential combined with a simulated annealing method |
title_sort |
modeling generalized stacking faults in au using the tight-binding potential combined with a simulated annealing method |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/104816 |
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