Modeling generalized stacking faults in Au using the tight-binding potential combined with a simulated annealing method

• Main Authors: Cai, J., Wang, J.-S.
• Other Authors: COMPUTATIONAL SCIENCE
• Format: Article
• Published: 2014
• Subjects: 61.72.Nn stacking faults and other planar or extended defects; 71.15.Nc Total energy and cohesive energy calculations
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/104816
• Institution: National University of Singapore

10.1140/epjb/e2002-00197-6