X-ray analysis and microhardness characterization of TiN/Ti multilayers
International Journal of Modern Physics B
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2014
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sg-nus-scholar.10635-1073252015-02-01T01:55:13Z X-ray analysis and microhardness characterization of TiN/Ti multilayers Li, W. Gong, H. Cai, J. Wang, Y. MATERIALS SCIENCE International Journal of Modern Physics B 16 1-2 275-280 IJPBE 2014-10-29T08:42:44Z 2014-10-29T08:42:44Z 2002-01-20 Conference Paper Li, W.,Gong, H.,Cai, J.,Wang, Y. (2002-01-20). X-ray analysis and microhardness characterization of TiN/Ti multilayers. International Journal of Modern Physics B 16 (1-2) : 275-280. ScholarBank@NUS Repository. 02179792 http://scholarbank.nus.edu.sg/handle/10635/107325 NOT_IN_WOS Scopus |
| institution |
National University of Singapore |
| building |
NUS Library |
| country |
Singapore |
| collection |
ScholarBank@NUS |
| description |
International Journal of Modern Physics B |
| author2 |
MATERIALS SCIENCE |
| author_facet |
MATERIALS SCIENCE Li, W. Gong, H. Cai, J. Wang, Y. |
| format |
Conference or Workshop Item |
| author |
Li, W. Gong, H. Cai, J. Wang, Y. |
| spellingShingle |
Li, W. Gong, H. Cai, J. Wang, Y. X-ray analysis and microhardness characterization of TiN/Ti multilayers |
| author_sort |
Li, W. |
| title |
X-ray analysis and microhardness characterization of TiN/Ti multilayers |
| title_short |
X-ray analysis and microhardness characterization of TiN/Ti multilayers |
| title_full |
X-ray analysis and microhardness characterization of TiN/Ti multilayers |
| title_fullStr |
X-ray analysis and microhardness characterization of TiN/Ti multilayers |
| title_full_unstemmed |
X-ray analysis and microhardness characterization of TiN/Ti multilayers |
| title_sort |
x-ray analysis and microhardness characterization of tin/ti multilayers |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/107325 |
| _version_ |
1681093624698241024 |