X-ray analysis and microhardness characterization of TiN/Ti multilayers

International Journal of Modern Physics B

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Bibliographic Details
Main Authors: Li, W., Gong, H., Cai, J., Wang, Y.
Other Authors: MATERIALS SCIENCE
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/107325
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Institution: National University of Singapore

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