X-ray analysis and microhardness characterization of TiN/Ti multilayers

International Journal of Modern Physics B

Saved in:
Bibliographic Details
Main Authors: Li, W., Gong, H., Cai, J., Wang, Y.
Other Authors: MATERIALS SCIENCE
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/107325
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore
Be the first to leave a comment!
You must be logged in first