Amorphous (CeO2)0.67(Al2O3)0.33 high-k gate dielectric thin films on silicon

10.1088/0268-1242/18/7/101

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Bibliographic Details
Main Authors: Yan, L., Kong, L.B., Li, Q., Ong, C.K.
Other Authors: TEMASEK LABORATORIES
Format: Others
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/111657
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Institution: National University of Singapore