Chemical and dielectrical characteristics of ultrathin oxides grown by atomic force microscopy and scanning electron beam
10.1063/1.1901814
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2014
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sg-nus-scholar.10635-1125822023-10-25T22:40:27Z Chemical and dielectrical characteristics of ultrathin oxides grown by atomic force microscopy and scanning electron beam Xie, X.N. Chung, H.J. Sow, C.H. Wee, A.T.S. PHYSICS NUS NANOSCIENCE & NANOTECH INITIATIVE 10.1063/1.1901814 Applied Physics Letters 86 19 1-3 APPLA 2014-11-28T06:33:04Z 2014-11-28T06:33:04Z 2005-05-09 Article Xie, X.N., Chung, H.J., Sow, C.H., Wee, A.T.S. (2005-05-09). Chemical and dielectrical characteristics of ultrathin oxides grown by atomic force microscopy and scanning electron beam. Applied Physics Letters 86 (19) : 1-3. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1901814 00036951 http://scholarbank.nus.edu.sg/handle/10635/112582 000229397900067 Scopus |
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National University of Singapore |
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Asia |
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Singapore Singapore |
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| description |
10.1063/1.1901814 |
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PHYSICS |
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PHYSICS Xie, X.N. Chung, H.J. Sow, C.H. Wee, A.T.S. |
| format |
Article |
| author |
Xie, X.N. Chung, H.J. Sow, C.H. Wee, A.T.S. |
| spellingShingle |
Xie, X.N. Chung, H.J. Sow, C.H. Wee, A.T.S. Chemical and dielectrical characteristics of ultrathin oxides grown by atomic force microscopy and scanning electron beam |
| author_sort |
Xie, X.N. |
| title |
Chemical and dielectrical characteristics of ultrathin oxides grown by atomic force microscopy and scanning electron beam |
| title_short |
Chemical and dielectrical characteristics of ultrathin oxides grown by atomic force microscopy and scanning electron beam |
| title_full |
Chemical and dielectrical characteristics of ultrathin oxides grown by atomic force microscopy and scanning electron beam |
| title_fullStr |
Chemical and dielectrical characteristics of ultrathin oxides grown by atomic force microscopy and scanning electron beam |
| title_full_unstemmed |
Chemical and dielectrical characteristics of ultrathin oxides grown by atomic force microscopy and scanning electron beam |
| title_sort |
chemical and dielectrical characteristics of ultrathin oxides grown by atomic force microscopy and scanning electron beam |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/112582 |
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1781789096939618304 |