An improved but reliable model for MESFET parasitic capacitance extraction

IEEE Radio Frequency Integrated Circuits Symposium, RFIC, Digest of Technical Papers

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Bibliographic Details
Main Authors: Ooi, B.L., Ma, J.Y.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/114541
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Institution: National University of Singapore
Description
Summary:IEEE Radio Frequency Integrated Circuits Symposium, RFIC, Digest of Technical Papers