An improved but reliable model for MESFET parasitic capacitance extraction
IEEE Radio Frequency Integrated Circuits Symposium, RFIC, Digest of Technical Papers
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Main Authors: | Ooi, B.L., Ma, J.Y. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/114541 |
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Institution: | National University of Singapore |
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