Suppressed leakage in low temperature RTA (700°C 30S) junctions with buried epitaxial Si 1-yC y

Proceedings - Electrochemical Society

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Main Authors: Tan, C.F., Lee, H., Liu, J.P., Quek, E., Chan, L., Chor, E.F.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/114585
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spelling sg-nus-scholar.10635-1145852015-01-10T06:10:34Z Suppressed leakage in low temperature RTA (700°C 30S) junctions with buried epitaxial Si 1-yC y Tan, C.F. Lee, H. Liu, J.P. Quek, E. Chan, L. Chor, E.F. ELECTRICAL & COMPUTER ENGINEERING Proceedings - Electrochemical Society PV 2005-05 554-561 2014-12-02T08:06:15Z 2014-12-02T08:06:15Z 2005 Conference Paper Tan, C.F.,Lee, H.,Liu, J.P.,Quek, E.,Chan, L.,Chor, E.F. (2005). Suppressed leakage in low temperature RTA (700°C 30S) junctions with buried epitaxial Si 1-yC y. Proceedings - Electrochemical Society PV 2005-05 : 554-561. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/114585 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description Proceedings - Electrochemical Society
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Tan, C.F.
Lee, H.
Liu, J.P.
Quek, E.
Chan, L.
Chor, E.F.
format Conference or Workshop Item
author Tan, C.F.
Lee, H.
Liu, J.P.
Quek, E.
Chan, L.
Chor, E.F.
spellingShingle Tan, C.F.
Lee, H.
Liu, J.P.
Quek, E.
Chan, L.
Chor, E.F.
Suppressed leakage in low temperature RTA (700°C 30S) junctions with buried epitaxial Si 1-yC y
author_sort Tan, C.F.
title Suppressed leakage in low temperature RTA (700°C 30S) junctions with buried epitaxial Si 1-yC y
title_short Suppressed leakage in low temperature RTA (700°C 30S) junctions with buried epitaxial Si 1-yC y
title_full Suppressed leakage in low temperature RTA (700°C 30S) junctions with buried epitaxial Si 1-yC y
title_fullStr Suppressed leakage in low temperature RTA (700°C 30S) junctions with buried epitaxial Si 1-yC y
title_full_unstemmed Suppressed leakage in low temperature RTA (700°C 30S) junctions with buried epitaxial Si 1-yC y
title_sort suppressed leakage in low temperature rta (700°c 30s) junctions with buried epitaxial si 1-yc y
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/114585
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