Variations in nanometer CMOS flip-flops: Part II - Energy variability and impact of other sources of variations

Variations in nanometer CMOS flip-flops: Part II - Energy variability and impact of other sources of variations

IEEE Transactions on Circuits and Systems I: Regular Papers

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Bibliographic Details
Main Authors: Alioto, Massimo Bruno, Consoli, Elio, Palumbo, Gaeteno
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: Institute of Electrical and Electronics Engineers Inc. 2016
Online Access:http://scholarbank.nus.edu.sg/handle/10635/123470
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Institution: National University of Singapore
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Summary:IEEE Transactions on Circuits and Systems I: Regular Papers

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