Variations in nanometer CMOS flip-flops: Part II - Energy variability and impact of other sources of variations
IEEE Transactions on Circuits and Systems I: Regular Papers
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Main Authors: | Alioto, Massimo Bruno, Consoli, Elio, Palumbo, Gaeteno |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
Institute of Electrical and Electronics Engineers Inc.
2016
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/123470 |
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Institution: | National University of Singapore |
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