Inter-laboratory study of eddy-current measurement of excess-carrier recombination lifetime

Inter-laboratory study of eddy-current measurement of excess-carrier recombination lifetime

10.1109/PVSC.2013.6744405

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Main Authors: Blum, A.L., Swirhun, J.S., Sinton, R.A., Yan, F., Herasimenka, S., Roth, T., Lauer, K., Haunschild, J., Lim, B., Bothe, K., Hameiri, Z., Seipel, B., Xiong, R., Dhamrin, M., Murphy, J.D.
Other Authors: SOLAR ENERGY RESEARCH INST OF S'PORE
Format: Conference or Workshop Item
Published: 2016
Subjects:
Charge carrier lifetime
Eddy currents
Photoconductivity
Silicon
Online Access:http://scholarbank.nus.edu.sg/handle/10635/128554
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-1285542024-11-09T13:08:42Z Inter-laboratory study of eddy-current measurement of excess-carrier recombination lifetime Blum, A.L. Swirhun, J.S. Sinton, R.A. Yan, F. Herasimenka, S. Roth, T. Lauer, K. Haunschild, J. Lim, B. Bothe, K. Hameiri, Z. Seipel, B. Xiong, R. Dhamrin, M. Murphy, J.D. SOLAR ENERGY RESEARCH INST OF S'PORE Charge carrier lifetime Eddy currents Photoconductivity Silicon 10.1109/PVSC.2013.6744405 Conference Record of the IEEE Photovoltaic Specialists Conference 1396-1401 CRCND 2016-10-18T06:27:41Z 2016-10-18T06:27:41Z 2013 Conference Paper Blum, A.L.,Swirhun, J.S.,Sinton, R.A.,Yan, F.,Herasimenka, S.,Roth, T.,Lauer, K.,Haunschild, J.,Lim, B.,Bothe, K.,Hameiri, Z.,Seipel, B.,Xiong, R.,Dhamrin, M.,Murphy, J.D. (2013). Inter-laboratory study of eddy-current measurement of excess-carrier recombination lifetime. Conference Record of the IEEE Photovoltaic Specialists Conference : 1396-1401. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/PVSC.2013.6744405" target="_blank">https://doi.org/10.1109/PVSC.2013.6744405</a> 9781479932993 01608371 http://scholarbank.nus.edu.sg/handle/10635/128554 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
topic Charge carrier lifetime
Eddy currents
Photoconductivity
Silicon
spellingShingle Charge carrier lifetime
Eddy currents
Photoconductivity
Silicon
Blum, A.L.
Swirhun, J.S.
Sinton, R.A.
Yan, F.
Herasimenka, S.
Roth, T.
Lauer, K.
Haunschild, J.
Lim, B.
Bothe, K.
Hameiri, Z.
Seipel, B.
Xiong, R.
Dhamrin, M.
Murphy, J.D.
Inter-laboratory study of eddy-current measurement of excess-carrier recombination lifetime
description 10.1109/PVSC.2013.6744405
author2 SOLAR ENERGY RESEARCH INST OF S'PORE
author_facet SOLAR ENERGY RESEARCH INST OF S'PORE
Blum, A.L.
Swirhun, J.S.
Sinton, R.A.
Yan, F.
Herasimenka, S.
Roth, T.
Lauer, K.
Haunschild, J.
Lim, B.
Bothe, K.
Hameiri, Z.
Seipel, B.
Xiong, R.
Dhamrin, M.
Murphy, J.D.
format Conference or Workshop Item
author Blum, A.L.
Swirhun, J.S.
Sinton, R.A.
Yan, F.
Herasimenka, S.
Roth, T.
Lauer, K.
Haunschild, J.
Lim, B.
Bothe, K.
Hameiri, Z.
Seipel, B.
Xiong, R.
Dhamrin, M.
Murphy, J.D.
author_sort Blum, A.L.
title Inter-laboratory study of eddy-current measurement of excess-carrier recombination lifetime
title_short Inter-laboratory study of eddy-current measurement of excess-carrier recombination lifetime
title_full Inter-laboratory study of eddy-current measurement of excess-carrier recombination lifetime
title_fullStr Inter-laboratory study of eddy-current measurement of excess-carrier recombination lifetime
title_full_unstemmed Inter-laboratory study of eddy-current measurement of excess-carrier recombination lifetime
title_sort inter-laboratory study of eddy-current measurement of excess-carrier recombination lifetime
publishDate 2016
url http://scholarbank.nus.edu.sg/handle/10635/128554
_version_ 1821183019132649472

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