Inter-laboratory study of eddy-current measurement of excess-carrier recombination lifetime

• Main Authors: Blum, A.L., Swirhun, J.S., Sinton, R.A., Yan, F., Herasimenka, S., Roth, T., Lauer, K., Haunschild, J., Lim, B., Bothe, K., Hameiri, Z., Seipel, B., Xiong, R., Dhamrin, M., Murphy, J.D.
• Other Authors: SOLAR ENERGY RESEARCH INST OF S'PORE
• Format: Conference or Workshop Item
• Published: 2016
• Subjects: Charge carrier lifetime; Eddy currents; Photoconductivity; Silicon
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/128554
• Institution: National University of Singapore

10.1109/PVSC.2013.6744405