Inter-laboratory study of eddy-current measurement of excess-carrier recombination lifetime
10.1109/PVSC.2013.6744405
محفوظ في:
| المؤلفون الرئيسيون: | , , , , , , , , , , , , , , |
|---|---|
| مؤلفون آخرون: | |
| التنسيق: | Conference or Workshop Item |
| منشور في: |
2016
|
| الموضوعات: | |
| الوصول للمادة أونلاين: | http://scholarbank.nus.edu.sg/handle/10635/128554 |
| الوسوم: |
إضافة وسم
لا توجد وسوم, كن أول من يضع وسما على هذه التسجيلة!
|
| id |
sg-nus-scholar.10635-128554 |
|---|---|
| record_format |
dspace |
| spelling |
sg-nus-scholar.10635-1285542024-11-09T13:08:42Z Inter-laboratory study of eddy-current measurement of excess-carrier recombination lifetime Blum, A.L. Swirhun, J.S. Sinton, R.A. Yan, F. Herasimenka, S. Roth, T. Lauer, K. Haunschild, J. Lim, B. Bothe, K. Hameiri, Z. Seipel, B. Xiong, R. Dhamrin, M. Murphy, J.D. SOLAR ENERGY RESEARCH INST OF S'PORE Charge carrier lifetime Eddy currents Photoconductivity Silicon 10.1109/PVSC.2013.6744405 Conference Record of the IEEE Photovoltaic Specialists Conference 1396-1401 CRCND 2016-10-18T06:27:41Z 2016-10-18T06:27:41Z 2013 Conference Paper Blum, A.L.,Swirhun, J.S.,Sinton, R.A.,Yan, F.,Herasimenka, S.,Roth, T.,Lauer, K.,Haunschild, J.,Lim, B.,Bothe, K.,Hameiri, Z.,Seipel, B.,Xiong, R.,Dhamrin, M.,Murphy, J.D. (2013). Inter-laboratory study of eddy-current measurement of excess-carrier recombination lifetime. Conference Record of the IEEE Photovoltaic Specialists Conference : 1396-1401. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/PVSC.2013.6744405" target="_blank">https://doi.org/10.1109/PVSC.2013.6744405</a> 9781479932993 01608371 http://scholarbank.nus.edu.sg/handle/10635/128554 NOT_IN_WOS Scopus |
| institution |
National University of Singapore |
| building |
NUS Library |
| continent |
Asia |
| country |
Singapore Singapore |
| content_provider |
NUS Library |
| collection |
ScholarBank@NUS |
| topic |
Charge carrier lifetime Eddy currents Photoconductivity Silicon |
| spellingShingle |
Charge carrier lifetime Eddy currents Photoconductivity Silicon Blum, A.L. Swirhun, J.S. Sinton, R.A. Yan, F. Herasimenka, S. Roth, T. Lauer, K. Haunschild, J. Lim, B. Bothe, K. Hameiri, Z. Seipel, B. Xiong, R. Dhamrin, M. Murphy, J.D. Inter-laboratory study of eddy-current measurement of excess-carrier recombination lifetime |
| description |
10.1109/PVSC.2013.6744405 |
| author2 |
SOLAR ENERGY RESEARCH INST OF S'PORE |
| author_facet |
SOLAR ENERGY RESEARCH INST OF S'PORE Blum, A.L. Swirhun, J.S. Sinton, R.A. Yan, F. Herasimenka, S. Roth, T. Lauer, K. Haunschild, J. Lim, B. Bothe, K. Hameiri, Z. Seipel, B. Xiong, R. Dhamrin, M. Murphy, J.D. |
| format |
Conference or Workshop Item |
| author |
Blum, A.L. Swirhun, J.S. Sinton, R.A. Yan, F. Herasimenka, S. Roth, T. Lauer, K. Haunschild, J. Lim, B. Bothe, K. Hameiri, Z. Seipel, B. Xiong, R. Dhamrin, M. Murphy, J.D. |
| author_sort |
Blum, A.L. |
| title |
Inter-laboratory study of eddy-current measurement of excess-carrier recombination lifetime |
| title_short |
Inter-laboratory study of eddy-current measurement of excess-carrier recombination lifetime |
| title_full |
Inter-laboratory study of eddy-current measurement of excess-carrier recombination lifetime |
| title_fullStr |
Inter-laboratory study of eddy-current measurement of excess-carrier recombination lifetime |
| title_full_unstemmed |
Inter-laboratory study of eddy-current measurement of excess-carrier recombination lifetime |
| title_sort |
inter-laboratory study of eddy-current measurement of excess-carrier recombination lifetime |
| publishDate |
2016 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/128554 |
| _version_ |
1821183019132649472 |