Inter-laboratory study of eddy-current measurement of excess-carrier recombination lifetime

• Main Authors: Blum, A.L., Swirhun, J.S., Sinton, R.A., Yan, F., Herasimenka, S., Roth, T., Lauer, K., Haunschild, J., Lim, B., Bothe, K., Hameiri, Z., Seipel, B., Xiong, R., Dhamrin, M., Murphy, J.D.
• 其他作者: SOLAR ENERGY RESEARCH INST OF S'PORE
• 格式: Conference or Workshop Item
• 出版: 2016
• 主題: Charge carrier lifetime; Eddy currents; Photoconductivity; Silicon
• 在線閱讀: http://scholarbank.nus.edu.sg/handle/10635/128554
• 機構: National University of Singapore

10.1109/PVSC.2013.6744405