Hafnium oxide based high-k dielectric gate stack

Ph.D

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Main Author: LI QIN
Other Authors: PHYSICS
Format: Theses and Dissertations
Language:English
Published: 2010
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Online Access:http://scholarbank.nus.edu.sg/handle/10635/13035
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Institution: National University of Singapore
Language: English
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spelling sg-nus-scholar.10635-130352017-10-21T09:32:13Z Hafnium oxide based high-k dielectric gate stack LI QIN PHYSICS ONG CHONG KIM High-k dielectric,Metal/HfO2/semiconductor,Band alignment,Schottky barrier height,X-ray photoelectron spectroscopy,Density functional theory Ph.D DOCTOR OF PHILOSOPHY 2010-04-08T10:29:23Z 2010-04-08T10:29:23Z 2008-02-20 Thesis LI QIN (2008-02-20). Hafnium oxide based high-k dielectric gate stack. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/13035 NOT_IN_WOS en
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
language English
topic High-k dielectric,Metal/HfO2/semiconductor,Band alignment,Schottky barrier height,X-ray photoelectron spectroscopy,Density functional theory
spellingShingle High-k dielectric,Metal/HfO2/semiconductor,Band alignment,Schottky barrier height,X-ray photoelectron spectroscopy,Density functional theory
LI QIN
Hafnium oxide based high-k dielectric gate stack
description Ph.D
author2 PHYSICS
author_facet PHYSICS
LI QIN
format Theses and Dissertations
author LI QIN
author_sort LI QIN
title Hafnium oxide based high-k dielectric gate stack
title_short Hafnium oxide based high-k dielectric gate stack
title_full Hafnium oxide based high-k dielectric gate stack
title_fullStr Hafnium oxide based high-k dielectric gate stack
title_full_unstemmed Hafnium oxide based high-k dielectric gate stack
title_sort hafnium oxide based high-k dielectric gate stack
publishDate 2010
url http://scholarbank.nus.edu.sg/handle/10635/13035
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