Quantum modeling and characterization of deep submicron MOSFETs

Ph.D

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Bibliographic Details
Main Author:	HOU YONG TIAN
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Theses and Dissertations
Language:	English
Published:	2010
Subjects:	CMOS devices; Quantum Mechanical Effects; Direct Tunneling Current; Ultrathin Gate Oxide; High Dielectric Constant Dielectrics; Metal Gate.
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/14015
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Institution:	National University of Singapore
Language:	English

id	sg-nus-scholar.10635-14015
record_format	dspace
spelling	sg-nus-scholar.10635-140152015-01-18T23:08:49Z Quantum modeling and characterization of deep submicron MOSFETs HOU YONG TIAN ELECTRICAL & COMPUTER ENGINEERING LI MING-FU CMOS devices; Quantum Mechanical Effects; Direct Tunneling Current; Ultrathin Gate Oxide; High Dielectric Constant Dielectrics; Metal Gate. Ph.D DOCTOR OF PHILOSOPHY 2010-04-08T10:39:01Z 2010-04-08T10:39:01Z 2004-05-17 Thesis HOU YONG TIAN (2004-05-17). Quantum modeling and characterization of deep submicron MOSFETs. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/14015 NOT_IN_WOS en
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
language	English
topic	CMOS devices; Quantum Mechanical Effects; Direct Tunneling Current; Ultrathin Gate Oxide; High Dielectric Constant Dielectrics; Metal Gate.
spellingShingle	CMOS devices; Quantum Mechanical Effects; Direct Tunneling Current; Ultrathin Gate Oxide; High Dielectric Constant Dielectrics; Metal Gate. HOU YONG TIAN Quantum modeling and characterization of deep submicron MOSFETs
description	Ph.D
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING HOU YONG TIAN
format	Theses and Dissertations
author	HOU YONG TIAN
author_sort	HOU YONG TIAN
title	Quantum modeling and characterization of deep submicron MOSFETs
title_short	Quantum modeling and characterization of deep submicron MOSFETs
title_full	Quantum modeling and characterization of deep submicron MOSFETs
title_fullStr	Quantum modeling and characterization of deep submicron MOSFETs
title_full_unstemmed	Quantum modeling and characterization of deep submicron MOSFETs
title_sort	quantum modeling and characterization of deep submicron mosfets
publishDate	2010
url	http://scholarbank.nus.edu.sg/handle/10635/14015
_version_	1681078955660017664

Quantum modeling and characterization of deep submicron MOSFETs

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