STT-MRAMS CIRCUIT TECHNIQUES FOR ENHANCED ROBUSTNESS IN LOW POWER EMBEDDED APPLICATIONS

STT-MRAMS CIRCUIT TECHNIQUES FOR ENHANCED ROBUSTNESS IN LOW POWER EMBEDDED APPLICATIONS

Ph.D

Saved in:
Bibliographic Details
Main Author: TRINH QUANG KIEN
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Theses and Dissertations
Language:English
Published: 2018
Subjects:
STT-MRAM, sensing margin, dynamic voltage scaling, variations, read robustness, spintronics
Online Access:http://scholarbank.nus.edu.sg/handle/10635/141255
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore
Language: English

Internet

http://scholarbank.nus.edu.sg/handle/10635/141255

Similar Items