STT-MRAMS CIRCUIT TECHNIQUES FOR ENHANCED ROBUSTNESS IN LOW POWER EMBEDDED APPLICATIONS

Ph.D

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Bibliographic Details
Main Author:	TRINH QUANG KIEN
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Theses and Dissertations
Language:	English
Published:	2018
Subjects:	STT-MRAM, sensing margin, dynamic voltage scaling, variations, read robustness, spintronics
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/141255
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Institution:	National University of Singapore
Language:	English

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