Stress-induced leakage current in dual-gate CMOSFETS with thin nitrided gate oxides

Master's

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Bibliographic Details
Main Author:	HUANG JINSHENG
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Theses and Dissertations
Language:	English
Published:	2010
Subjects:	Stress-induced leakage current, dual gate CMOSFETs, thin nitrided gate oxides
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/14491
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Institution:	National University of Singapore
Language:	English

id	sg-nus-scholar.10635-14491
record_format	dspace
spelling	sg-nus-scholar.10635-144912024-10-26T02:28:47Z Stress-induced leakage current in dual-gate CMOSFETS with thin nitrided gate oxides HUANG JINSHENG ELECTRICAL & COMPUTER ENGINEERING LING CHUNG HO Stress-induced leakage current, dual gate CMOSFETs, thin nitrided gate oxides Master's MASTER OF ENGINEERING 2010-04-08T10:43:41Z 2010-04-08T10:43:41Z 2005-02-04 Thesis HUANG JINSHENG (2005-02-04). Stress-induced leakage current in dual-gate CMOSFETS with thin nitrided gate oxides. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/14491 NOT_IN_WOS en
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
language	English
topic	Stress-induced leakage current, dual gate CMOSFETs, thin nitrided gate oxides
spellingShingle	Stress-induced leakage current, dual gate CMOSFETs, thin nitrided gate oxides HUANG JINSHENG Stress-induced leakage current in dual-gate CMOSFETS with thin nitrided gate oxides
description	Master's
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING HUANG JINSHENG
format	Theses and Dissertations
author	HUANG JINSHENG
author_sort	HUANG JINSHENG
title	Stress-induced leakage current in dual-gate CMOSFETS with thin nitrided gate oxides
title_short	Stress-induced leakage current in dual-gate CMOSFETS with thin nitrided gate oxides
title_full	Stress-induced leakage current in dual-gate CMOSFETS with thin nitrided gate oxides
title_fullStr	Stress-induced leakage current in dual-gate CMOSFETS with thin nitrided gate oxides
title_full_unstemmed	Stress-induced leakage current in dual-gate CMOSFETS with thin nitrided gate oxides
title_sort	stress-induced leakage current in dual-gate cmosfets with thin nitrided gate oxides
publishDate	2010
url	http://scholarbank.nus.edu.sg/handle/10635/14491
_version_	1821189258322378752

Stress-induced leakage current in dual-gate CMOSFETS with thin nitrided gate oxides

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