Characterization of hot carrier reliability in deep submicronmeter MOSFETs

Ph.D

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Bibliographic Details
Main Author:	LIAO HONG
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Theses and Dissertations
Language:	English
Published:	2010
Subjects:	MOSFET, hot carrier effect, reliability, gate oxide, interface, degradation
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/14920
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Institution:	National University of Singapore
Language:	English

id	sg-nus-scholar.10635-14920
record_format	dspace
spelling	sg-nus-scholar.10635-149202017-10-21T05:57:52Z Characterization of hot carrier reliability in deep submicronmeter MOSFETs LIAO HONG ELECTRICAL & COMPUTER ENGINEERING LING CHUNG HO MOSFET, hot carrier effect, reliability, gate oxide, interface, degradation Ph.D DOCTOR OF PHILOSOPHY 2010-04-08T10:48:11Z 2010-04-08T10:48:11Z 2005-11-16 Thesis LIAO HONG (2005-11-16). Characterization of hot carrier reliability in deep submicronmeter MOSFETs. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/14920 NOT_IN_WOS en
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
language	English
topic	MOSFET, hot carrier effect, reliability, gate oxide, interface, degradation
spellingShingle	MOSFET, hot carrier effect, reliability, gate oxide, interface, degradation LIAO HONG Characterization of hot carrier reliability in deep submicronmeter MOSFETs
description	Ph.D
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING LIAO HONG
format	Theses and Dissertations
author	LIAO HONG
author_sort	LIAO HONG
title	Characterization of hot carrier reliability in deep submicronmeter MOSFETs
title_short	Characterization of hot carrier reliability in deep submicronmeter MOSFETs
title_full	Characterization of hot carrier reliability in deep submicronmeter MOSFETs
title_fullStr	Characterization of hot carrier reliability in deep submicronmeter MOSFETs
title_full_unstemmed	Characterization of hot carrier reliability in deep submicronmeter MOSFETs
title_sort	characterization of hot carrier reliability in deep submicronmeter mosfets
publishDate	2010
url	http://scholarbank.nus.edu.sg/handle/10635/14920
_version_	1681079107819929600

Characterization of hot carrier reliability in deep submicronmeter MOSFETs

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