Modeling and characterization of high dielectric constant tunnel barriers for nanoelectronic applications

Ph.D

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Bibliographic Details
Main Author:	KOH BIH HIAN
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Theses and Dissertations
Language:	English
Published:	2010
Subjects:	Germanium nanocrystal;Flash memory;Nonvolatile memory;High-k dielectric materials;Quantum mechanical modeling;Novel tunnel barriers
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/15008
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Institution:	National University of Singapore
Language:	English

id	sg-nus-scholar.10635-15008
record_format	dspace
spelling	sg-nus-scholar.10635-150082017-10-21T09:37:37Z Modeling and characterization of high dielectric constant tunnel barriers for nanoelectronic applications KOH BIH HIAN ELECTRICAL & COMPUTER ENGINEERING CHIM WAI KIN Germanium nanocrystal;Flash memory;Nonvolatile memory;High-k dielectric materials;Quantum mechanical modeling;Novel tunnel barriers Ph.D DOCTOR OF PHILOSOPHY 2010-04-08T10:49:07Z 2010-04-08T10:49:07Z 2005-11-29 Thesis KOH BIH HIAN (2005-11-29). Modeling and characterization of high dielectric constant tunnel barriers for nanoelectronic applications. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/15008 NOT_IN_WOS en
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
language	English
topic	Germanium nanocrystal;Flash memory;Nonvolatile memory;High-k dielectric materials;Quantum mechanical modeling;Novel tunnel barriers
spellingShingle	Germanium nanocrystal;Flash memory;Nonvolatile memory;High-k dielectric materials;Quantum mechanical modeling;Novel tunnel barriers KOH BIH HIAN Modeling and characterization of high dielectric constant tunnel barriers for nanoelectronic applications
description	Ph.D
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING KOH BIH HIAN
format	Theses and Dissertations
author	KOH BIH HIAN
author_sort	KOH BIH HIAN
title	Modeling and characterization of high dielectric constant tunnel barriers for nanoelectronic applications
title_short	Modeling and characterization of high dielectric constant tunnel barriers for nanoelectronic applications
title_full	Modeling and characterization of high dielectric constant tunnel barriers for nanoelectronic applications
title_fullStr	Modeling and characterization of high dielectric constant tunnel barriers for nanoelectronic applications
title_full_unstemmed	Modeling and characterization of high dielectric constant tunnel barriers for nanoelectronic applications
title_sort	modeling and characterization of high dielectric constant tunnel barriers for nanoelectronic applications
publishDate	2010
url	http://scholarbank.nus.edu.sg/handle/10635/15008
_version_	1681079122491604992

Modeling and characterization of high dielectric constant tunnel barriers for nanoelectronic applications

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