Evidence for line width and carrier screening effects on excitonic valley relaxation in 2D semiconductors
10.1038/s41467-018-04988-x
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2019
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sg-nus-scholar.10635-1525252023-11-01T07:55:52Z Evidence for line width and carrier screening effects on excitonic valley relaxation in 2D semiconductors Miyauchi Y. Konabe S. Wang F. Zhang W. Hwang A. Hasegawa Y. Zhou L. Mouri S. Toh M. Eda G. Matsuda K. DEPT OF PHYSICS 10.1038/s41467-018-04988-x Nature Communications 9 1 2598 2019-03-21T08:34:35Z 2019-03-21T08:34:35Z 2018 Article Miyauchi Y., Konabe S., Wang F., Zhang W., Hwang A., Hasegawa Y., Zhou L., Mouri S., Toh M., Eda G., Matsuda K. (2018). Evidence for line width and carrier screening effects on excitonic valley relaxation in 2D semiconductors. Nature Communications 9 (1) : 2598. ScholarBank@NUS Repository. https://doi.org/10.1038/s41467-018-04988-x 20411723 http://scholarbank.nus.edu.sg/handle/10635/152525 Nature Publishing Group Scopus |
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10.1038/s41467-018-04988-x |
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DEPT OF PHYSICS |
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DEPT OF PHYSICS Miyauchi Y. Konabe S. Wang F. Zhang W. Hwang A. Hasegawa Y. Zhou L. Mouri S. Toh M. Eda G. Matsuda K. |
| format |
Article |
| author |
Miyauchi Y. Konabe S. Wang F. Zhang W. Hwang A. Hasegawa Y. Zhou L. Mouri S. Toh M. Eda G. Matsuda K. |
| spellingShingle |
Miyauchi Y. Konabe S. Wang F. Zhang W. Hwang A. Hasegawa Y. Zhou L. Mouri S. Toh M. Eda G. Matsuda K. Evidence for line width and carrier screening effects on excitonic valley relaxation in 2D semiconductors |
| author_sort |
Miyauchi Y. |
| title |
Evidence for line width and carrier screening effects on excitonic valley relaxation in 2D semiconductors |
| title_short |
Evidence for line width and carrier screening effects on excitonic valley relaxation in 2D semiconductors |
| title_full |
Evidence for line width and carrier screening effects on excitonic valley relaxation in 2D semiconductors |
| title_fullStr |
Evidence for line width and carrier screening effects on excitonic valley relaxation in 2D semiconductors |
| title_full_unstemmed |
Evidence for line width and carrier screening effects on excitonic valley relaxation in 2D semiconductors |
| title_sort |
evidence for line width and carrier screening effects on excitonic valley relaxation in 2d semiconductors |
| publisher |
Nature Publishing Group |
| publishDate |
2019 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/152525 |
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1781791622423379968 |