EBAC DEVELOPMENT IN NANO-PROBER FOR RESISTIVE CONTACT/VIA ISOLATION IN ADVANCED 45NM/32NM MICROPROCESSORS

EBAC DEVELOPMENT IN NANO-PROBER FOR RESISTIVE CONTACT/VIA ISOLATION IN ADVANCED 45NM/32NM MICROPROCESSORS

Master's

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Bibliographic Details
Main Author: CHEN YALIANG
Other Authors: SINGAPORE-MIT ALLIANCE
Format: Theses and Dissertations
Published: 2019
Subjects:
EBAC
Absorbed Current
Failure Analysis
Fault Location
Nano-Probe
SEM
resistive open
short
Online Access:https://scholarbank.nus.edu.sg/handle/10635/153672
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Institution: National University of Singapore
id sg-nus-scholar.10635-153672
record_format dspace
spelling sg-nus-scholar.10635-1536722024-10-26T00:12:28Z EBAC DEVELOPMENT IN NANO-PROBER FOR RESISTIVE CONTACT/VIA ISOLATION IN ADVANCED 45NM/32NM MICROPROCESSORS CHEN YALIANG SINGAPORE-MIT ALLIANCE PEY KIN LEONG VINOD NARANG LIM SOON HUAT EBAC Absorbed Current Failure Analysis Fault Location Nano-Probe SEM resistive open short Master's MASTER OF SCIENCE IN ADVANCED MATERIALS FOR MICRO- & NANO- SYSTEMS Dissertation Supervisors: 1. Prof. Pey Kin Leong, SMA Fellow, NTU. 2. Mr. Vinod Narang, Advanced Micro Devices (Singapore) 3. Mr. Lim Soon Huat, Advanced Micro Devices (Singapore) 2019-05-03T03:33:20Z 2019-05-03T03:33:20Z 2009 Thesis CHEN YALIANG (2009). EBAC DEVELOPMENT IN NANO-PROBER FOR RESISTIVE CONTACT/VIA ISOLATION IN ADVANCED 45NM/32NM MICROPROCESSORS. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/153672 SMA BATCHLOAD 20190422
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
topic EBAC
Absorbed Current
Failure Analysis
Fault Location
Nano-Probe
SEM
resistive open
short
spellingShingle EBAC
Absorbed Current
Failure Analysis
Fault Location
Nano-Probe
SEM
resistive open
short
CHEN YALIANG
EBAC DEVELOPMENT IN NANO-PROBER FOR RESISTIVE CONTACT/VIA ISOLATION IN ADVANCED 45NM/32NM MICROPROCESSORS
description Master's
author2 SINGAPORE-MIT ALLIANCE
author_facet SINGAPORE-MIT ALLIANCE
CHEN YALIANG
format Theses and Dissertations
author CHEN YALIANG
author_sort CHEN YALIANG
title EBAC DEVELOPMENT IN NANO-PROBER FOR RESISTIVE CONTACT/VIA ISOLATION IN ADVANCED 45NM/32NM MICROPROCESSORS
title_short EBAC DEVELOPMENT IN NANO-PROBER FOR RESISTIVE CONTACT/VIA ISOLATION IN ADVANCED 45NM/32NM MICROPROCESSORS
title_full EBAC DEVELOPMENT IN NANO-PROBER FOR RESISTIVE CONTACT/VIA ISOLATION IN ADVANCED 45NM/32NM MICROPROCESSORS
title_fullStr EBAC DEVELOPMENT IN NANO-PROBER FOR RESISTIVE CONTACT/VIA ISOLATION IN ADVANCED 45NM/32NM MICROPROCESSORS
title_full_unstemmed EBAC DEVELOPMENT IN NANO-PROBER FOR RESISTIVE CONTACT/VIA ISOLATION IN ADVANCED 45NM/32NM MICROPROCESSORS
title_sort ebac development in nano-prober for resistive contact/via isolation in advanced 45nm/32nm microprocessors
publishDate 2019
url https://scholarbank.nus.edu.sg/handle/10635/153672
_version_ 1821212094288101376

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