Die-to-Die Interconnect Studies using Copper Pillars with Tin-Silver Solder Bumps

Master's

Saved in:
Bibliographic Details
Main Author: DAVID ALLEN WONG
Other Authors: SINGAPORE-MIT ALLIANCE
Format: Theses and Dissertations
Published: 2019
Subjects:
Online Access:https://scholarbank.nus.edu.sg/handle/10635/153885
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore
id sg-nus-scholar.10635-153885
record_format dspace
spelling sg-nus-scholar.10635-1538852019-05-09T13:10:13Z Die-to-Die Interconnect Studies using Copper Pillars with Tin-Silver Solder Bumps DAVID ALLEN WONG SINGAPORE-MIT ALLIANCE Copper pillar bumps oven reflow (attach and reflow) local reflow (thermocompression) no-clean flux Master's MASTER OF SCIENCE IN ADVANCED MATERIALS FOR MICRO- & NANO- SYSTEMS 2019-05-09T04:10:23Z 2019-05-09T04:10:23Z 2010 Thesis DAVID ALLEN WONG (2010). Die-to-Die Interconnect Studies using Copper Pillars with Tin-Silver Solder Bumps. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/153885 SMA BATCHLOAD 20190422
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
topic Copper pillar bumps
oven reflow (attach and reflow)
local reflow (thermocompression)
no-clean flux
spellingShingle Copper pillar bumps
oven reflow (attach and reflow)
local reflow (thermocompression)
no-clean flux
DAVID ALLEN WONG
Die-to-Die Interconnect Studies using Copper Pillars with Tin-Silver Solder Bumps
description Master's
author2 SINGAPORE-MIT ALLIANCE
author_facet SINGAPORE-MIT ALLIANCE
DAVID ALLEN WONG
format Theses and Dissertations
author DAVID ALLEN WONG
author_sort DAVID ALLEN WONG
title Die-to-Die Interconnect Studies using Copper Pillars with Tin-Silver Solder Bumps
title_short Die-to-Die Interconnect Studies using Copper Pillars with Tin-Silver Solder Bumps
title_full Die-to-Die Interconnect Studies using Copper Pillars with Tin-Silver Solder Bumps
title_fullStr Die-to-Die Interconnect Studies using Copper Pillars with Tin-Silver Solder Bumps
title_full_unstemmed Die-to-Die Interconnect Studies using Copper Pillars with Tin-Silver Solder Bumps
title_sort die-to-die interconnect studies using copper pillars with tin-silver solder bumps
publishDate 2019
url https://scholarbank.nus.edu.sg/handle/10635/153885
_version_ 1681099309820411904