Die-to-Die Interconnect Studies using Copper Pillars with Tin-Silver Solder Bumps

Master's

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書目詳細資料
主要作者: DAVID ALLEN WONG
其他作者: SINGAPORE-MIT ALLIANCE
格式: Theses and Dissertations
出版: 2019
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在線閱讀:https://scholarbank.nus.edu.sg/handle/10635/153885
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機構: National University of Singapore
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spelling sg-nus-scholar.10635-1538852024-10-26T00:13:18Z Die-to-Die Interconnect Studies using Copper Pillars with Tin-Silver Solder Bumps DAVID ALLEN WONG SINGAPORE-MIT ALLIANCE Copper pillar bumps oven reflow (attach and reflow) local reflow (thermocompression) no-clean flux Master's MASTER OF SCIENCE IN ADVANCED MATERIALS FOR MICRO- & NANO- SYSTEMS 2019-05-09T04:10:23Z 2019-05-09T04:10:23Z 2010 Thesis DAVID ALLEN WONG (2010). Die-to-Die Interconnect Studies using Copper Pillars with Tin-Silver Solder Bumps. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/153885 SMA BATCHLOAD 20190422
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
topic Copper pillar bumps
oven reflow (attach and reflow)
local reflow (thermocompression)
no-clean flux
spellingShingle Copper pillar bumps
oven reflow (attach and reflow)
local reflow (thermocompression)
no-clean flux
DAVID ALLEN WONG
Die-to-Die Interconnect Studies using Copper Pillars with Tin-Silver Solder Bumps
description Master's
author2 SINGAPORE-MIT ALLIANCE
author_facet SINGAPORE-MIT ALLIANCE
DAVID ALLEN WONG
format Theses and Dissertations
author DAVID ALLEN WONG
author_sort DAVID ALLEN WONG
title Die-to-Die Interconnect Studies using Copper Pillars with Tin-Silver Solder Bumps
title_short Die-to-Die Interconnect Studies using Copper Pillars with Tin-Silver Solder Bumps
title_full Die-to-Die Interconnect Studies using Copper Pillars with Tin-Silver Solder Bumps
title_fullStr Die-to-Die Interconnect Studies using Copper Pillars with Tin-Silver Solder Bumps
title_full_unstemmed Die-to-Die Interconnect Studies using Copper Pillars with Tin-Silver Solder Bumps
title_sort die-to-die interconnect studies using copper pillars with tin-silver solder bumps
publishDate 2019
url https://scholarbank.nus.edu.sg/handle/10635/153885
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