TEM Study of a RTO Oxide-Interfacial Layer on Epitaxial-Cobalt Silicide (CoSi2) Formation

Master's

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Main Author: Ng Khim Hong
Other Authors: SINGAPORE-MIT ALLIANCE
Format: Theses and Dissertations
Published: 2019
Online Access:https://scholarbank.nus.edu.sg/handle/10635/154219
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-1542192024-10-26T00:10:54Z TEM Study of a RTO Oxide-Interfacial Layer on Epitaxial-Cobalt Silicide (CoSi2) Formation Ng Khim Hong SINGAPORE-MIT ALLIANCE Pey Kin Leong Lap Chan Eddie Er Dai Jiyan Gerbrand Cede Master's MASTER OF SCIENCE IN ADVANCED MATERIALS Thesis Supervisors: 1. Assistant Prof Pey Kin Leong SMA Fellow. 2. Dr Lap Chan, Chartered Semiconductor Manufacturing Ltd. 3. Mr Eddie Er, Chartered Semiconductor Manufacturing Ltd. 4. Dr Dai Jiyan, Chartered Semiconductor Manufacturing Ltd. 5. Assoc Prof Gerbrand Ceder, SMA Fellow 2019-05-17T07:15:09Z 2019-05-17T07:15:09Z 2000 Thesis Ng Khim Hong (2000). TEM Study of a RTO Oxide-Interfacial Layer on Epitaxial-Cobalt Silicide (CoSi2) Formation. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/154219 SMA BATCHLOAD 20190422
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description Master's
author2 SINGAPORE-MIT ALLIANCE
author_facet SINGAPORE-MIT ALLIANCE
Ng Khim Hong
format Theses and Dissertations
author Ng Khim Hong
spellingShingle Ng Khim Hong
TEM Study of a RTO Oxide-Interfacial Layer on Epitaxial-Cobalt Silicide (CoSi2) Formation
author_sort Ng Khim Hong
title TEM Study of a RTO Oxide-Interfacial Layer on Epitaxial-Cobalt Silicide (CoSi2) Formation
title_short TEM Study of a RTO Oxide-Interfacial Layer on Epitaxial-Cobalt Silicide (CoSi2) Formation
title_full TEM Study of a RTO Oxide-Interfacial Layer on Epitaxial-Cobalt Silicide (CoSi2) Formation
title_fullStr TEM Study of a RTO Oxide-Interfacial Layer on Epitaxial-Cobalt Silicide (CoSi2) Formation
title_full_unstemmed TEM Study of a RTO Oxide-Interfacial Layer on Epitaxial-Cobalt Silicide (CoSi2) Formation
title_sort tem study of a rto oxide-interfacial layer on epitaxial-cobalt silicide (cosi2) formation
publishDate 2019
url https://scholarbank.nus.edu.sg/handle/10635/154219
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