Soft x-ray free electron laser microfocus for exploring matter under extreme conditions

• Main Authors: NELSON, AJ, TOLEIKIS, S, CHAPMAN, H, BAJT, S, KRZYWINSKI, J, CHALUPSKY, J, JUHA, L, CIHELKA, J, HAJKOVA, V, VYSIN, L, BURIAN, T, KOZLOVA, M, FäUSTLIN, RR, NAGLER, B, VINKO, SM, WHITCHER, T, DZELZAINIS, T, RENNER, O, SAKSL, K, KHORSAND, AR, HEIMANN, PA, SOBIERAJSKI, R, KLINGER, D, JUREK, M, PELKA, J, IWAN, B, ANDREASSON, J, TIMNEANU, N, FAJARDO, M, WARK, JS, RILEY, D, TSCHENTSCHER, T, HAJDU, J, LEE, RW
• 其他作者: CENTRE FOR ADVANCED 2D MATERIALS
• 格式: Article
• 出版: The Optical Society 2019
• 在線閱讀: https://scholarbank.nus.edu.sg/handle/10635/155138
• 機構: National University of Singapore

10.1364/oe.17.018271