Soft x-ray free electron laser microfocus for exploring matter under extreme conditions

10.1364/oe.17.018271

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Main Authors: NELSON, AJ, TOLEIKIS, S, CHAPMAN, H, BAJT, S, KRZYWINSKI, J, CHALUPSKY, J, JUHA, L, CIHELKA, J, HAJKOVA, V, VYSIN, L, BURIAN, T, KOZLOVA, M, FäUSTLIN, RR, NAGLER, B, VINKO, SM, WHITCHER, T, DZELZAINIS, T, RENNER, O, SAKSL, K, KHORSAND, AR, HEIMANN, PA, SOBIERAJSKI, R, KLINGER, D, JUREK, M, PELKA, J, IWAN, B, ANDREASSON, J, TIMNEANU, N, FAJARDO, M, WARK, JS, RILEY, D, TSCHENTSCHER, T, HAJDU, J, LEE, RW
Other Authors: CENTRE FOR ADVANCED 2D MATERIALS
Format: Article
Published: The Optical Society 2019
Online Access:https://scholarbank.nus.edu.sg/handle/10635/155138
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-1551382023-09-07T22:15:40Z Soft x-ray free electron laser microfocus for exploring matter under extreme conditions NELSON, AJ TOLEIKIS, S CHAPMAN, H BAJT, S KRZYWINSKI, J CHALUPSKY, J JUHA, L CIHELKA, J HAJKOVA, V VYSIN, L BURIAN, T KOZLOVA, M FäUSTLIN, RR NAGLER, B VINKO, SM WHITCHER, T DZELZAINIS, T RENNER, O SAKSL, K KHORSAND, AR HEIMANN, PA SOBIERAJSKI, R KLINGER, D JUREK, M PELKA, J IWAN, B ANDREASSON, J TIMNEANU, N FAJARDO, M WARK, JS RILEY, D TSCHENTSCHER, T HAJDU, J LEE, RW CENTRE FOR ADVANCED 2D MATERIALS 10.1364/oe.17.018271 Optics Express 17 20 18271-18271 2019-06-04T03:24:08Z 2019-06-04T03:24:08Z 2009-09-28 2019-06-03T06:48:04Z Article NELSON, AJ, TOLEIKIS, S, CHAPMAN, H, BAJT, S, KRZYWINSKI, J, CHALUPSKY, J, JUHA, L, CIHELKA, J, HAJKOVA, V, VYSIN, L, BURIAN, T, KOZLOVA, M, FäUSTLIN, RR, NAGLER, B, VINKO, SM, WHITCHER, T, DZELZAINIS, T, RENNER, O, SAKSL, K, KHORSAND, AR, HEIMANN, PA, SOBIERAJSKI, R, KLINGER, D, JUREK, M, PELKA, J, IWAN, B, ANDREASSON, J, TIMNEANU, N, FAJARDO, M, WARK, JS, RILEY, D, TSCHENTSCHER, T, HAJDU, J, LEE, RW (2009-09-28). Soft x-ray free electron laser microfocus for exploring matter under extreme conditions. Optics Express 17 (20) : 18271-18271. ScholarBank@NUS Repository. https://doi.org/10.1364/oe.17.018271 10944087 https://scholarbank.nus.edu.sg/handle/10635/155138 The Optical Society Elements
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1364/oe.17.018271
author2 CENTRE FOR ADVANCED 2D MATERIALS
author_facet CENTRE FOR ADVANCED 2D MATERIALS
NELSON, AJ
TOLEIKIS, S
CHAPMAN, H
BAJT, S
KRZYWINSKI, J
CHALUPSKY, J
JUHA, L
CIHELKA, J
HAJKOVA, V
VYSIN, L
BURIAN, T
KOZLOVA, M
FäUSTLIN, RR
NAGLER, B
VINKO, SM
WHITCHER, T
DZELZAINIS, T
RENNER, O
SAKSL, K
KHORSAND, AR
HEIMANN, PA
SOBIERAJSKI, R
KLINGER, D
JUREK, M
PELKA, J
IWAN, B
ANDREASSON, J
TIMNEANU, N
FAJARDO, M
WARK, JS
RILEY, D
TSCHENTSCHER, T
HAJDU, J
LEE, RW
format Article
author NELSON, AJ
TOLEIKIS, S
CHAPMAN, H
BAJT, S
KRZYWINSKI, J
CHALUPSKY, J
JUHA, L
CIHELKA, J
HAJKOVA, V
VYSIN, L
BURIAN, T
KOZLOVA, M
FäUSTLIN, RR
NAGLER, B
VINKO, SM
WHITCHER, T
DZELZAINIS, T
RENNER, O
SAKSL, K
KHORSAND, AR
HEIMANN, PA
SOBIERAJSKI, R
KLINGER, D
JUREK, M
PELKA, J
IWAN, B
ANDREASSON, J
TIMNEANU, N
FAJARDO, M
WARK, JS
RILEY, D
TSCHENTSCHER, T
HAJDU, J
LEE, RW
spellingShingle NELSON, AJ
TOLEIKIS, S
CHAPMAN, H
BAJT, S
KRZYWINSKI, J
CHALUPSKY, J
JUHA, L
CIHELKA, J
HAJKOVA, V
VYSIN, L
BURIAN, T
KOZLOVA, M
FäUSTLIN, RR
NAGLER, B
VINKO, SM
WHITCHER, T
DZELZAINIS, T
RENNER, O
SAKSL, K
KHORSAND, AR
HEIMANN, PA
SOBIERAJSKI, R
KLINGER, D
JUREK, M
PELKA, J
IWAN, B
ANDREASSON, J
TIMNEANU, N
FAJARDO, M
WARK, JS
RILEY, D
TSCHENTSCHER, T
HAJDU, J
LEE, RW
Soft x-ray free electron laser microfocus for exploring matter under extreme conditions
author_sort NELSON, AJ
title Soft x-ray free electron laser microfocus for exploring matter under extreme conditions
title_short Soft x-ray free electron laser microfocus for exploring matter under extreme conditions
title_full Soft x-ray free electron laser microfocus for exploring matter under extreme conditions
title_fullStr Soft x-ray free electron laser microfocus for exploring matter under extreme conditions
title_full_unstemmed Soft x-ray free electron laser microfocus for exploring matter under extreme conditions
title_sort soft x-ray free electron laser microfocus for exploring matter under extreme conditions
publisher The Optical Society
publishDate 2019
url https://scholarbank.nus.edu.sg/handle/10635/155138
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