Soft x-ray free electron laser microfocus for exploring matter under extreme conditions
10.1364/oe.17.018271
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The Optical Society
2019
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sg-nus-scholar.10635-1551382023-09-07T22:15:40Z Soft x-ray free electron laser microfocus for exploring matter under extreme conditions NELSON, AJ TOLEIKIS, S CHAPMAN, H BAJT, S KRZYWINSKI, J CHALUPSKY, J JUHA, L CIHELKA, J HAJKOVA, V VYSIN, L BURIAN, T KOZLOVA, M FäUSTLIN, RR NAGLER, B VINKO, SM WHITCHER, T DZELZAINIS, T RENNER, O SAKSL, K KHORSAND, AR HEIMANN, PA SOBIERAJSKI, R KLINGER, D JUREK, M PELKA, J IWAN, B ANDREASSON, J TIMNEANU, N FAJARDO, M WARK, JS RILEY, D TSCHENTSCHER, T HAJDU, J LEE, RW CENTRE FOR ADVANCED 2D MATERIALS 10.1364/oe.17.018271 Optics Express 17 20 18271-18271 2019-06-04T03:24:08Z 2019-06-04T03:24:08Z 2009-09-28 2019-06-03T06:48:04Z Article NELSON, AJ, TOLEIKIS, S, CHAPMAN, H, BAJT, S, KRZYWINSKI, J, CHALUPSKY, J, JUHA, L, CIHELKA, J, HAJKOVA, V, VYSIN, L, BURIAN, T, KOZLOVA, M, FäUSTLIN, RR, NAGLER, B, VINKO, SM, WHITCHER, T, DZELZAINIS, T, RENNER, O, SAKSL, K, KHORSAND, AR, HEIMANN, PA, SOBIERAJSKI, R, KLINGER, D, JUREK, M, PELKA, J, IWAN, B, ANDREASSON, J, TIMNEANU, N, FAJARDO, M, WARK, JS, RILEY, D, TSCHENTSCHER, T, HAJDU, J, LEE, RW (2009-09-28). Soft x-ray free electron laser microfocus for exploring matter under extreme conditions. Optics Express 17 (20) : 18271-18271. ScholarBank@NUS Repository. https://doi.org/10.1364/oe.17.018271 10944087 https://scholarbank.nus.edu.sg/handle/10635/155138 The Optical Society Elements |
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10.1364/oe.17.018271 |
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CENTRE FOR ADVANCED 2D MATERIALS |
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CENTRE FOR ADVANCED 2D MATERIALS NELSON, AJ TOLEIKIS, S CHAPMAN, H BAJT, S KRZYWINSKI, J CHALUPSKY, J JUHA, L CIHELKA, J HAJKOVA, V VYSIN, L BURIAN, T KOZLOVA, M FäUSTLIN, RR NAGLER, B VINKO, SM WHITCHER, T DZELZAINIS, T RENNER, O SAKSL, K KHORSAND, AR HEIMANN, PA SOBIERAJSKI, R KLINGER, D JUREK, M PELKA, J IWAN, B ANDREASSON, J TIMNEANU, N FAJARDO, M WARK, JS RILEY, D TSCHENTSCHER, T HAJDU, J LEE, RW |
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Article |
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NELSON, AJ TOLEIKIS, S CHAPMAN, H BAJT, S KRZYWINSKI, J CHALUPSKY, J JUHA, L CIHELKA, J HAJKOVA, V VYSIN, L BURIAN, T KOZLOVA, M FäUSTLIN, RR NAGLER, B VINKO, SM WHITCHER, T DZELZAINIS, T RENNER, O SAKSL, K KHORSAND, AR HEIMANN, PA SOBIERAJSKI, R KLINGER, D JUREK, M PELKA, J IWAN, B ANDREASSON, J TIMNEANU, N FAJARDO, M WARK, JS RILEY, D TSCHENTSCHER, T HAJDU, J LEE, RW |
spellingShingle |
NELSON, AJ TOLEIKIS, S CHAPMAN, H BAJT, S KRZYWINSKI, J CHALUPSKY, J JUHA, L CIHELKA, J HAJKOVA, V VYSIN, L BURIAN, T KOZLOVA, M FäUSTLIN, RR NAGLER, B VINKO, SM WHITCHER, T DZELZAINIS, T RENNER, O SAKSL, K KHORSAND, AR HEIMANN, PA SOBIERAJSKI, R KLINGER, D JUREK, M PELKA, J IWAN, B ANDREASSON, J TIMNEANU, N FAJARDO, M WARK, JS RILEY, D TSCHENTSCHER, T HAJDU, J LEE, RW Soft x-ray free electron laser microfocus for exploring matter under extreme conditions |
author_sort |
NELSON, AJ |
title |
Soft x-ray free electron laser microfocus for exploring matter under extreme conditions |
title_short |
Soft x-ray free electron laser microfocus for exploring matter under extreme conditions |
title_full |
Soft x-ray free electron laser microfocus for exploring matter under extreme conditions |
title_fullStr |
Soft x-ray free electron laser microfocus for exploring matter under extreme conditions |
title_full_unstemmed |
Soft x-ray free electron laser microfocus for exploring matter under extreme conditions |
title_sort |
soft x-ray free electron laser microfocus for exploring matter under extreme conditions |
publisher |
The Optical Society |
publishDate |
2019 |
url |
https://scholarbank.nus.edu.sg/handle/10635/155138 |
_version_ |
1778169067787517952 |