Yield, Area, and Energy Optimization in STT-MRAMs Using Failure-Aware ECC

• Main Authors: Pajouhi, Zoha, Fong, Xuanyao, Raghunathan, Anand, Roy, Kaushik
• 其他作者: ELECTRICAL AND COMPUTER ENGINEERING
• 格式: Article
• 語言: English
• 出版: ASSOC COMPUTING MACHINERY 2019
• 主題: Science & Technology; Technology; Computer Science, Hardware & Architecture; Engineering, Electrical & Electronic; Nanoscience & Nanotechnology; Computer Science; Engineering; Science & Technology - Other Topics; Embedded memories; emerging technologies; LOW-COST; SPIN
• 在線閱讀: https://scholarbank.nus.edu.sg/handle/10635/156196
• 機構: National University of Singapore

10.1145/2934685