Yield, Area, and Energy Optimization in STT-MRAMs Using Failure-Aware ECC

Yield, Area, and Energy Optimization in STT-MRAMs Using Failure-Aware ECC

10.1145/2934685

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Bibliographic Details
Main Authors:	Pajouhi, Zoha, Fong, Xuanyao, Raghunathan, Anand, Roy, Kaushik
Other Authors:	DEPT OF ELECTRICAL & COMPUTER ENGG
Format:	Article
Language:	English
Published:	ASSOC COMPUTING MACHINERY 2019
Subjects:	Science & Technology Technology Computer Science, Hardware & Architecture Engineering, Electrical & Electronic Nanoscience & Nanotechnology Computer Science Engineering Science & Technology - Other Topics Embedded memories emerging technologies LOW-COST SPIN
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/156196
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Institution:	National University of Singapore
Language:	English

Description
Summary:	10.1145/2934685