Device/Circuit/Architecture Co-Design of Reliable STT-MRAM

Device/Circuit/Architecture Co-Design of Reliable STT-MRAM

10.7873/DATE.2015.0145

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Bibliographic Details
Main Authors: Pajouhi, Zoha, Fong, Xuanyao, Roy, Kaushik
Other Authors: DEPT OF ELECTRICAL & COMPUTER ENGG
Format: Conference or Workshop Item
Published: IEEE 2019
Subjects:
Science & Technology
Technology
Computer Science, Hardware & Architecture
Computer Science, Software Engineering
Engineering, Electrical & Electronic
Computer Science
Engineering
STT-MRAM
Online Access:https://scholarbank.nus.edu.sg/handle/10635/156203
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Institution: National University of Singapore
Description
Summary:10.7873/DATE.2015.0145

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