TCAD MODELLING AND CHARACTERIZATION OF DEFECTS IN ADVANCED NANOSCALE SEMICONDUCTOR DEVICES

TCAD MODELLING AND CHARACTERIZATION OF DEFECTS IN ADVANCED NANOSCALE SEMICONDUCTOR DEVICES

Master's

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Bibliographic Details
Main Author: TEO CHEA WEI
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Theses and Dissertations
Language:English
Published: 2019
Subjects:
Failure Analysis, TCAD, FinFET, machine learning,
Online Access:https://scholarbank.nus.edu.sg/handle/10635/158100
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Institution: National University of Singapore
Language: English
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spelling sg-nus-scholar.10635-1581002019-09-02T13:16:06Z TCAD MODELLING AND CHARACTERIZATION OF DEFECTS IN ADVANCED NANOSCALE SEMICONDUCTOR DEVICES TEO CHEA WEI ELECTRICAL & COMPUTER ENGINEERING THEAN VOON YEW, AARON Failure Analysis, TCAD, FinFET, machine learning, Master's MASTER OF ENGINEERING 2019-09-01T18:02:06Z 2019-09-01T18:02:06Z 2019-05-17 Thesis TEO CHEA WEI (2019-05-17). TCAD MODELLING AND CHARACTERIZATION OF DEFECTS IN ADVANCED NANOSCALE SEMICONDUCTOR DEVICES. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/158100 en
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
language English
topic Failure Analysis, TCAD, FinFET, machine learning,
spellingShingle Failure Analysis, TCAD, FinFET, machine learning,
TEO CHEA WEI
TCAD MODELLING AND CHARACTERIZATION OF DEFECTS IN ADVANCED NANOSCALE SEMICONDUCTOR DEVICES
description Master's
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
TEO CHEA WEI
format Theses and Dissertations
author TEO CHEA WEI
author_sort TEO CHEA WEI
title TCAD MODELLING AND CHARACTERIZATION OF DEFECTS IN ADVANCED NANOSCALE SEMICONDUCTOR DEVICES
title_short TCAD MODELLING AND CHARACTERIZATION OF DEFECTS IN ADVANCED NANOSCALE SEMICONDUCTOR DEVICES
title_full TCAD MODELLING AND CHARACTERIZATION OF DEFECTS IN ADVANCED NANOSCALE SEMICONDUCTOR DEVICES
title_fullStr TCAD MODELLING AND CHARACTERIZATION OF DEFECTS IN ADVANCED NANOSCALE SEMICONDUCTOR DEVICES
title_full_unstemmed TCAD MODELLING AND CHARACTERIZATION OF DEFECTS IN ADVANCED NANOSCALE SEMICONDUCTOR DEVICES
title_sort tcad modelling and characterization of defects in advanced nanoscale semiconductor devices
publishDate 2019
url https://scholarbank.nus.edu.sg/handle/10635/158100
_version_ 1681099745373716480

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