A STUDY ON THE HOT-CARRIER DEGRADATION OF WIDE AND NARROW CHANNEL NMOSFET DEVICES WITH RECESSED-LOCOS ISOLATION STRUCTURES

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Bibliographic Details
Main Author:	JEFFREY YUE MUN PUN
Other Authors:	ELECTRICAL AND COMPUTER ENGINEERING
Format:	Theses and Dissertations
Published:	2019
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/158740
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Institution:	National University of Singapore

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spelling	sg-nus-scholar.10635-1587402024-10-26T00:50:40Z A STUDY ON THE HOT-CARRIER DEGRADATION OF WIDE AND NARROW CHANNEL NMOSFET DEVICES WITH RECESSED-LOCOS ISOLATION STRUCTURES JEFFREY YUE MUN PUN ELECTRICAL AND COMPUTER ENGINEERING CHIM WAI KIN CHO BYUNG JIN Master's MASTER OF ENGINEERING 2019-09-16T02:36:50Z 2019-09-16T02:36:50Z 2001 Thesis JEFFREY YUE MUN PUN (2001). A STUDY ON THE HOT-CARRIER DEGRADATION OF WIDE AND NARROW CHANNEL NMOSFET DEVICES WITH RECESSED-LOCOS ISOLATION STRUCTURES. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/158740 CCK BATCHLOAD 20190911
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	Master's
author2	ELECTRICAL AND COMPUTER ENGINEERING
author_facet	ELECTRICAL AND COMPUTER ENGINEERING JEFFREY YUE MUN PUN
format	Theses and Dissertations
author	JEFFREY YUE MUN PUN
spellingShingle	JEFFREY YUE MUN PUN A STUDY ON THE HOT-CARRIER DEGRADATION OF WIDE AND NARROW CHANNEL NMOSFET DEVICES WITH RECESSED-LOCOS ISOLATION STRUCTURES
author_sort	JEFFREY YUE MUN PUN
title	A STUDY ON THE HOT-CARRIER DEGRADATION OF WIDE AND NARROW CHANNEL NMOSFET DEVICES WITH RECESSED-LOCOS ISOLATION STRUCTURES
title_short	A STUDY ON THE HOT-CARRIER DEGRADATION OF WIDE AND NARROW CHANNEL NMOSFET DEVICES WITH RECESSED-LOCOS ISOLATION STRUCTURES
title_full	A STUDY ON THE HOT-CARRIER DEGRADATION OF WIDE AND NARROW CHANNEL NMOSFET DEVICES WITH RECESSED-LOCOS ISOLATION STRUCTURES
title_fullStr	A STUDY ON THE HOT-CARRIER DEGRADATION OF WIDE AND NARROW CHANNEL NMOSFET DEVICES WITH RECESSED-LOCOS ISOLATION STRUCTURES
title_full_unstemmed	A STUDY ON THE HOT-CARRIER DEGRADATION OF WIDE AND NARROW CHANNEL NMOSFET DEVICES WITH RECESSED-LOCOS ISOLATION STRUCTURES
title_sort	study on the hot-carrier degradation of wide and narrow channel nmosfet devices with recessed-locos isolation structures
publishDate	2019
url	https://scholarbank.nus.edu.sg/handle/10635/158740
_version_	1821189835768987648

A STUDY ON THE HOT-CARRIER DEGRADATION OF WIDE AND NARROW CHANNEL NMOSFET DEVICES WITH RECESSED-LOCOS ISOLATION STRUCTURES

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