A STUDY ON THE HOT-CARRIER DEGRADATION OF WIDE AND NARROW CHANNEL NMOSFET DEVICES WITH RECESSED-LOCOS ISOLATION STRUCTURES

A STUDY ON THE HOT-CARRIER DEGRADATION OF WIDE AND NARROW CHANNEL NMOSFET DEVICES WITH RECESSED-LOCOS ISOLATION STRUCTURES

Master's

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Bibliographic Details
Main Author: JEFFREY YUE MUN PUN
Other Authors: DEPT OF ELECTRICAL & COMPUTER ENGG
Format: Theses and Dissertations
Published: 2019
Online Access:https://scholarbank.nus.edu.sg/handle/10635/160054
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Institution: National University of Singapore
id sg-nus-scholar.10635-160054
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spelling sg-nus-scholar.10635-1600542019-10-18T05:45:39Z A STUDY ON THE HOT-CARRIER DEGRADATION OF WIDE AND NARROW CHANNEL NMOSFET DEVICES WITH RECESSED-LOCOS ISOLATION STRUCTURES JEFFREY YUE MUN PUN DEPT OF ELECTRICAL & COMPUTER ENGG CHIM WAI KIN CHO BYUNG JIN Master's MASTER OF ENGINEERING 2019-10-18T05:45:39Z 2019-10-18T05:45:39Z 2001 Thesis JEFFREY YUE MUN PUN (2001). A STUDY ON THE HOT-CARRIER DEGRADATION OF WIDE AND NARROW CHANNEL NMOSFET DEVICES WITH RECESSED-LOCOS ISOLATION STRUCTURES. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/160054 CCK BATCHLOAD 20190911
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description Master's
author2 DEPT OF ELECTRICAL & COMPUTER ENGG
author_facet DEPT OF ELECTRICAL & COMPUTER ENGG
JEFFREY YUE MUN PUN
format Theses and Dissertations
author JEFFREY YUE MUN PUN
spellingShingle JEFFREY YUE MUN PUN
A STUDY ON THE HOT-CARRIER DEGRADATION OF WIDE AND NARROW CHANNEL NMOSFET DEVICES WITH RECESSED-LOCOS ISOLATION STRUCTURES
author_sort JEFFREY YUE MUN PUN
title A STUDY ON THE HOT-CARRIER DEGRADATION OF WIDE AND NARROW CHANNEL NMOSFET DEVICES WITH RECESSED-LOCOS ISOLATION STRUCTURES
title_short A STUDY ON THE HOT-CARRIER DEGRADATION OF WIDE AND NARROW CHANNEL NMOSFET DEVICES WITH RECESSED-LOCOS ISOLATION STRUCTURES
title_full A STUDY ON THE HOT-CARRIER DEGRADATION OF WIDE AND NARROW CHANNEL NMOSFET DEVICES WITH RECESSED-LOCOS ISOLATION STRUCTURES
title_fullStr A STUDY ON THE HOT-CARRIER DEGRADATION OF WIDE AND NARROW CHANNEL NMOSFET DEVICES WITH RECESSED-LOCOS ISOLATION STRUCTURES
title_full_unstemmed A STUDY ON THE HOT-CARRIER DEGRADATION OF WIDE AND NARROW CHANNEL NMOSFET DEVICES WITH RECESSED-LOCOS ISOLATION STRUCTURES
title_sort study on the hot-carrier degradation of wide and narrow channel nmosfet devices with recessed-locos isolation structures
publishDate 2019
url https://scholarbank.nus.edu.sg/handle/10635/160054
_version_ 1681100004629938176

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