SECONDARY ELECTRON SPECTROSCOPY INSIDE THE SCANNING ELECTRON MICROSCOPE AND ITS MATERIAL SCIENCE APPLICATIONS

Ph.D

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Bibliographic Details
Main Author:	HAN WEIDING
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Theses and Dissertations
Language:	English
Published:	2020
Subjects:	Secondary Electrons Spectroscopy, Scanning Electron Microscopes, Semiconductor Characterization, Dopant Profiling, Electron Energy Spectrometer
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/164194
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Institution:	National University of Singapore
Language:	English

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spelling	sg-nus-scholar.10635-1641942020-02-01T13:14:51Z SECONDARY ELECTRON SPECTROSCOPY INSIDE THE SCANNING ELECTRON MICROSCOPE AND ITS MATERIAL SCIENCE APPLICATIONS HAN WEIDING ELECTRICAL & COMPUTER ENGINEERING Khursheed, Anjam Secondary Electrons Spectroscopy, Scanning Electron Microscopes, Semiconductor Characterization, Dopant Profiling, Electron Energy Spectrometer Ph.D DOCTOR OF PHILOSOPHY (FOE) 2020-01-31T18:01:27Z 2020-01-31T18:01:27Z 2019-08-27 Thesis HAN WEIDING (2019-08-27). SECONDARY ELECTRON SPECTROSCOPY INSIDE THE SCANNING ELECTRON MICROSCOPE AND ITS MATERIAL SCIENCE APPLICATIONS. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/164194 0000-0002-4700-7088 en
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
language	English
topic	Secondary Electrons Spectroscopy, Scanning Electron Microscopes, Semiconductor Characterization, Dopant Profiling, Electron Energy Spectrometer
spellingShingle	Secondary Electrons Spectroscopy, Scanning Electron Microscopes, Semiconductor Characterization, Dopant Profiling, Electron Energy Spectrometer HAN WEIDING SECONDARY ELECTRON SPECTROSCOPY INSIDE THE SCANNING ELECTRON MICROSCOPE AND ITS MATERIAL SCIENCE APPLICATIONS
description	Ph.D
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING HAN WEIDING
format	Theses and Dissertations
author	HAN WEIDING
author_sort	HAN WEIDING
title	SECONDARY ELECTRON SPECTROSCOPY INSIDE THE SCANNING ELECTRON MICROSCOPE AND ITS MATERIAL SCIENCE APPLICATIONS
title_short	SECONDARY ELECTRON SPECTROSCOPY INSIDE THE SCANNING ELECTRON MICROSCOPE AND ITS MATERIAL SCIENCE APPLICATIONS
title_full	SECONDARY ELECTRON SPECTROSCOPY INSIDE THE SCANNING ELECTRON MICROSCOPE AND ITS MATERIAL SCIENCE APPLICATIONS
title_fullStr	SECONDARY ELECTRON SPECTROSCOPY INSIDE THE SCANNING ELECTRON MICROSCOPE AND ITS MATERIAL SCIENCE APPLICATIONS
title_full_unstemmed	SECONDARY ELECTRON SPECTROSCOPY INSIDE THE SCANNING ELECTRON MICROSCOPE AND ITS MATERIAL SCIENCE APPLICATIONS
title_sort	secondary electron spectroscopy inside the scanning electron microscope and its material science applications
publishDate	2020
url	https://scholarbank.nus.edu.sg/handle/10635/164194
_version_	1681100550084493312

SECONDARY ELECTRON SPECTROSCOPY INSIDE THE SCANNING ELECTRON MICROSCOPE AND ITS MATERIAL SCIENCE APPLICATIONS

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