Robust Degradation Analysis With Non-Gaussian Measurement Errors

Robust Degradation Analysis With Non-Gaussian Measurement Errors

10.1109/TIM.2017.2717278

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Bibliographic Details
Main Authors: ZHAI QINGQING, YE ZHISHENG
Other Authors: INDUSTRIAL SYSTEMS ENGINEERING AND MANAGEMENT
Format: Article
Published: Institute of Electrical and Electronics Engineers (IEEE) 2020
Online Access:https://scholarbank.nus.edu.sg/handle/10635/168379
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Institution: National University of Singapore
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Summary:10.1109/TIM.2017.2717278

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