Robust Degradation Analysis With Non-Gaussian Measurement Errors

10.1109/TIM.2017.2717278

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Bibliographic Details
Main Authors: ZHAI QINGQING, YE ZHISHENG
Other Authors: INDUSTRIAL SYSTEMS ENGINEERING AND MANAGEMENT
Format: Article
Published: Institute of Electrical and Electronics Engineers (IEEE) 2020
Online Access:https://scholarbank.nus.edu.sg/handle/10635/168379
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spelling sg-nus-scholar.10635-1683792024-04-05T02:09:35Z Robust Degradation Analysis With Non-Gaussian Measurement Errors ZHAI QINGQING YE ZHISHENG INDUSTRIAL SYSTEMS ENGINEERING AND MANAGEMENT 10.1109/TIM.2017.2717278 IEEE Transactions on Instrumentation and Measurement 66 11 2803-2812 2020-05-21T07:44:58Z 2020-05-21T07:44:58Z 2017-07-21 Article ZHAI QINGQING, YE ZHISHENG (2017-07-21). Robust Degradation Analysis With Non-Gaussian Measurement Errors. IEEE Transactions on Instrumentation and Measurement 66 (11) : 2803-2812. ScholarBank@NUS Repository. https://doi.org/10.1109/TIM.2017.2717278 00189456 15579662 https://scholarbank.nus.edu.sg/handle/10635/168379 Institute of Electrical and Electronics Engineers (IEEE)
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1109/TIM.2017.2717278
author2 INDUSTRIAL SYSTEMS ENGINEERING AND MANAGEMENT
author_facet INDUSTRIAL SYSTEMS ENGINEERING AND MANAGEMENT
ZHAI QINGQING
YE ZHISHENG
format Article
author ZHAI QINGQING
YE ZHISHENG
spellingShingle ZHAI QINGQING
YE ZHISHENG
Robust Degradation Analysis With Non-Gaussian Measurement Errors
author_sort ZHAI QINGQING
title Robust Degradation Analysis With Non-Gaussian Measurement Errors
title_short Robust Degradation Analysis With Non-Gaussian Measurement Errors
title_full Robust Degradation Analysis With Non-Gaussian Measurement Errors
title_fullStr Robust Degradation Analysis With Non-Gaussian Measurement Errors
title_full_unstemmed Robust Degradation Analysis With Non-Gaussian Measurement Errors
title_sort robust degradation analysis with non-gaussian measurement errors
publisher Institute of Electrical and Electronics Engineers (IEEE)
publishDate 2020
url https://scholarbank.nus.edu.sg/handle/10635/168379
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