Robust Degradation Analysis With Non-Gaussian Measurement Errors
10.1109/TIM.2017.2717278
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| Main Authors: | , |
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| Other Authors: | |
| Format: | Article |
| Published: |
Institute of Electrical and Electronics Engineers (IEEE)
2020
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| Online Access: | https://scholarbank.nus.edu.sg/handle/10635/168379 |
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| Institution: | National University of Singapore |
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