Oxygen Electromigration and Energy Band Reconstruction Induced by Electrolyte Field Effect at Oxide Interfaces

PHYSICAL REVIEW LETTERS

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Main Authors:	Zeng, S. W., Yin, X. M., Herng, T. S., Han, K., Huang, Z., Zhang, L. C., Li, C. J., Zhou, W. X., Wan, D. Y., Yang, P., Ding, J., Wee, A. T. S., Coey, J. M. D., Venkatesan, T., Rusydi, A., Ariando, A.
Other Authors:	CHEMICAL & BIOMOLECULAR ENGINEERING
Format:	Article
Published:	American Physical Society 2020
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/168578
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Institution:	National University of Singapore

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spelling	sg-nus-scholar.10635-1685782024-04-25T03:34:51Z Oxygen Electromigration and Energy Band Reconstruction Induced by Electrolyte Field Effect at Oxide Interfaces Zeng, S. W. Yin, X. M. Herng, T. S. Han, K. Huang, Z. Zhang, L. C. Li, C. J. Zhou, W. X. Wan, D. Y. Yang, P. Ding, J. Wee, A. T. S. Coey, J. M. D. Venkatesan, T. Rusydi, A. Ariando, A. CHEMICAL & BIOMOLECULAR ENGINEERING CHEMISTRY ELECTRICAL AND COMPUTER ENGINEERING MATERIALS SCIENCE AND ENGINEERING PHYSICS SINGAPORE SYNCHROTRON LIGHT SOURCE PHYSICAL REVIEW LETTERS 121 14 2020-05-28T03:16:57Z 2020-05-28T03:16:57Z 2018-10-05 Article Zeng, S. W., Yin, X. M., Herng, T. S., Han, K., Huang, Z., Zhang, L. C., Li, C. J., Zhou, W. X., Wan, D. Y., Yang, P., Ding, J., Wee, A. T. S., Coey, J. M. D., Venkatesan, T., Rusydi, A., Ariando, A. (2018-10-05). Oxygen Electromigration and Energy Band Reconstruction Induced by Electrolyte Field Effect at Oxide Interfaces. PHYSICAL REVIEW LETTERS 121 (14). ScholarBank@NUS Repository. 00319007 https://scholarbank.nus.edu.sg/handle/10635/168578 American Physical Society
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	PHYSICAL REVIEW LETTERS
author2	CHEMICAL & BIOMOLECULAR ENGINEERING
author_facet	CHEMICAL & BIOMOLECULAR ENGINEERING Zeng, S. W. Yin, X. M. Herng, T. S. Han, K. Huang, Z. Zhang, L. C. Li, C. J. Zhou, W. X. Wan, D. Y. Yang, P. Ding, J. Wee, A. T. S. Coey, J. M. D. Venkatesan, T. Rusydi, A. Ariando, A.
format	Article
author	Zeng, S. W. Yin, X. M. Herng, T. S. Han, K. Huang, Z. Zhang, L. C. Li, C. J. Zhou, W. X. Wan, D. Y. Yang, P. Ding, J. Wee, A. T. S. Coey, J. M. D. Venkatesan, T. Rusydi, A. Ariando, A.
spellingShingle	Zeng, S. W. Yin, X. M. Herng, T. S. Han, K. Huang, Z. Zhang, L. C. Li, C. J. Zhou, W. X. Wan, D. Y. Yang, P. Ding, J. Wee, A. T. S. Coey, J. M. D. Venkatesan, T. Rusydi, A. Ariando, A. Oxygen Electromigration and Energy Band Reconstruction Induced by Electrolyte Field Effect at Oxide Interfaces
author_sort	Zeng, S. W.
title	Oxygen Electromigration and Energy Band Reconstruction Induced by Electrolyte Field Effect at Oxide Interfaces
title_short	Oxygen Electromigration and Energy Band Reconstruction Induced by Electrolyte Field Effect at Oxide Interfaces
title_full	Oxygen Electromigration and Energy Band Reconstruction Induced by Electrolyte Field Effect at Oxide Interfaces
title_fullStr	Oxygen Electromigration and Energy Band Reconstruction Induced by Electrolyte Field Effect at Oxide Interfaces
title_full_unstemmed	Oxygen Electromigration and Energy Band Reconstruction Induced by Electrolyte Field Effect at Oxide Interfaces
title_sort	oxygen electromigration and energy band reconstruction induced by electrolyte field effect at oxide interfaces
publisher	American Physical Society
publishDate	2020
url	https://scholarbank.nus.edu.sg/handle/10635/168578
_version_	1800914016385630208

Oxygen Electromigration and Energy Band Reconstruction Induced by Electrolyte Field Effect at Oxide Interfaces

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