Oxygen Electromigration and Energy Band Reconstruction Induced by Electrolyte Field Effect at Oxide Interfaces

Oxygen Electromigration and Energy Band Reconstruction Induced by Electrolyte Field Effect at Oxide Interfaces

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Bibliographic Details
Main Authors: Zeng, S. W., Yin, X. M., Herng, T. S., Han, K., Huang, Z., Zhang, L. C., Li, C. J., Zhou, W. X., Wan, D. Y., Yang, P., Ding, J., Wee, A. T. S., Coey, J. M. D., Venkatesan, T., Rusydi, A., Ariando, A.
Other Authors: CHEMICAL & BIOMOLECULAR ENGINEERING
Format: Article
Published: American Physical Society 2020
Online Access:https://scholarbank.nus.edu.sg/handle/10635/168578
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Institution: National University of Singapore

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https://scholarbank.nus.edu.sg/handle/10635/168578

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