Numerical simulation of interface delamination - with application to IC packaging
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sg-nus-scholar.10635-169152017-10-21T07:37:56Z Numerical simulation of interface delamination - with application to IC packaging CHEONG WEE GEE MECHANICAL ENGINEERING CHENG LI Cell element model, IC packages, Interface delamination, Moisture Sensitivity Test, Vapor pressure, Void Growth Master's MASTER OF ENGINEERING 2010-05-13T19:10:28Z 2010-05-13T19:10:28Z 2005-03-15 Thesis CHEONG WEE GEE (2005-03-15). Numerical simulation of interface delamination - with application to IC packaging. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/16915 NOT_IN_WOS en |
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National University of Singapore |
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Singapore |
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ScholarBank@NUS |
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English |
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Cell element model, IC packages, Interface delamination, Moisture Sensitivity Test, Vapor pressure, Void Growth |
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Cell element model, IC packages, Interface delamination, Moisture Sensitivity Test, Vapor pressure, Void Growth CHEONG WEE GEE Numerical simulation of interface delamination - with application to IC packaging |
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Master's |
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MECHANICAL ENGINEERING |
author_facet |
MECHANICAL ENGINEERING CHEONG WEE GEE |
format |
Theses and Dissertations |
author |
CHEONG WEE GEE |
author_sort |
CHEONG WEE GEE |
title |
Numerical simulation of interface delamination - with application to IC packaging |
title_short |
Numerical simulation of interface delamination - with application to IC packaging |
title_full |
Numerical simulation of interface delamination - with application to IC packaging |
title_fullStr |
Numerical simulation of interface delamination - with application to IC packaging |
title_full_unstemmed |
Numerical simulation of interface delamination - with application to IC packaging |
title_sort |
numerical simulation of interface delamination - with application to ic packaging |
publishDate |
2010 |
url |
http://scholarbank.nus.edu.sg/handle/10635/16915 |
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1681079436223447040 |