Board level drop testing of advanced IC packaging

Master's

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Bibliographic Details
Main Author: PEK WEE SONG, ERIC
Other Authors: MECHANICAL ENGINEERING
Format: Theses and Dissertations
Language:English
Published: 2010
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/17004
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Institution: National University of Singapore
Language: English
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spelling sg-nus-scholar.10635-170042024-10-25T14:40:25Z Board level drop testing of advanced IC packaging PEK WEE SONG, ERIC MECHANICAL ENGINEERING LIM CHWEE TECK TAN BENG CHYE, VINCENT Drop test, impact, IC packaging, board level, ball grid array (BGA), cyclic bending Master's MASTER OF ENGINEERING 2010-05-13T19:27:24Z 2010-05-13T19:27:24Z 2005-03-22 Thesis PEK WEE SONG, ERIC (2005-03-22). Board level drop testing of advanced IC packaging. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/17004 NOT_IN_WOS en
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
language English
topic Drop test, impact, IC packaging, board level, ball grid array (BGA), cyclic bending
spellingShingle Drop test, impact, IC packaging, board level, ball grid array (BGA), cyclic bending
PEK WEE SONG, ERIC
Board level drop testing of advanced IC packaging
description Master's
author2 MECHANICAL ENGINEERING
author_facet MECHANICAL ENGINEERING
PEK WEE SONG, ERIC
format Theses and Dissertations
author PEK WEE SONG, ERIC
author_sort PEK WEE SONG, ERIC
title Board level drop testing of advanced IC packaging
title_short Board level drop testing of advanced IC packaging
title_full Board level drop testing of advanced IC packaging
title_fullStr Board level drop testing of advanced IC packaging
title_full_unstemmed Board level drop testing of advanced IC packaging
title_sort board level drop testing of advanced ic packaging
publishDate 2010
url http://scholarbank.nus.edu.sg/handle/10635/17004
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