NEW TECHNIQUES FOR THE CHARACTERIZATION OF HOT-CARRIER DEGRADATION IN MOS DEVICES
Ph.D
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| Format: | Theses and Dissertations |
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2020
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| Online Access: | https://scholarbank.nus.edu.sg/handle/10635/172286 |
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sg-nus-scholar.10635-1722862024-10-27T01:55:14Z NEW TECHNIQUES FOR THE CHARACTERIZATION OF HOT-CARRIER DEGRADATION IN MOS DEVICES LEANG SERN EE ELECTRICAL ENGINEERING DANIEL CHAN CHIM WAI KIN Ph.D DOCTOR OF PHILOSOPHY 2020-08-11T08:50:32Z 2020-08-11T08:50:32Z 1997 Thesis LEANG SERN EE (1997). NEW TECHNIQUES FOR THE CHARACTERIZATION OF HOT-CARRIER DEGRADATION IN MOS DEVICES. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/172286 CCK BATCHLOAD 20200814 |
| institution |
National University of Singapore |
| building |
NUS Library |
| continent |
Asia |
| country |
Singapore Singapore |
| content_provider |
NUS Library |
| collection |
ScholarBank@NUS |
| description |
Ph.D |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING LEANG SERN EE |
| format |
Theses and Dissertations |
| author |
LEANG SERN EE |
| spellingShingle |
LEANG SERN EE NEW TECHNIQUES FOR THE CHARACTERIZATION OF HOT-CARRIER DEGRADATION IN MOS DEVICES |
| author_sort |
LEANG SERN EE |
| title |
NEW TECHNIQUES FOR THE CHARACTERIZATION OF HOT-CARRIER DEGRADATION IN MOS DEVICES |
| title_short |
NEW TECHNIQUES FOR THE CHARACTERIZATION OF HOT-CARRIER DEGRADATION IN MOS DEVICES |
| title_full |
NEW TECHNIQUES FOR THE CHARACTERIZATION OF HOT-CARRIER DEGRADATION IN MOS DEVICES |
| title_fullStr |
NEW TECHNIQUES FOR THE CHARACTERIZATION OF HOT-CARRIER DEGRADATION IN MOS DEVICES |
| title_full_unstemmed |
NEW TECHNIQUES FOR THE CHARACTERIZATION OF HOT-CARRIER DEGRADATION IN MOS DEVICES |
| title_sort |
new techniques for the characterization of hot-carrier degradation in mos devices |
| publishDate |
2020 |
| url |
https://scholarbank.nus.edu.sg/handle/10635/172286 |
| _version_ |
1821217491908558848 |