ELECTRICAL CHARACTERISATION OF MOS GATE OXIDE

Master's

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Bibliographic Details
Main Author:	OOI JOO AIK
Other Authors:	ELECTRICAL ENGINEERING
Format:	Theses and Dissertations
Published:	2020
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/172362
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-172362
record_format	dspace
spelling	sg-nus-scholar.10635-1723622020-11-19T13:57:14Z ELECTRICAL CHARACTERISATION OF MOS GATE OXIDE OOI JOO AIK ELECTRICAL ENGINEERING C.H. LING Master's MASTER OF ENGINEERING 2020-08-11T10:13:13Z 2020-08-11T10:13:13Z 1996 Thesis OOI JOO AIK (1996). ELECTRICAL CHARACTERISATION OF MOS GATE OXIDE. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/172362 CCK BATCHLOAD 20200814
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	Master's
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING OOI JOO AIK
format	Theses and Dissertations
author	OOI JOO AIK
spellingShingle	OOI JOO AIK ELECTRICAL CHARACTERISATION OF MOS GATE OXIDE
author_sort	OOI JOO AIK
title	ELECTRICAL CHARACTERISATION OF MOS GATE OXIDE
title_short	ELECTRICAL CHARACTERISATION OF MOS GATE OXIDE
title_full	ELECTRICAL CHARACTERISATION OF MOS GATE OXIDE
title_fullStr	ELECTRICAL CHARACTERISATION OF MOS GATE OXIDE
title_full_unstemmed	ELECTRICAL CHARACTERISATION OF MOS GATE OXIDE
title_sort	electrical characterisation of mos gate oxide
publishDate	2020
url	https://scholarbank.nus.edu.sg/handle/10635/172362
_version_	1686108830753095680

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