ELECTRICAL CHARACTERIZATION OF N2O ANNEALED GATE OXIDE

Master's

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Main Author: DAI FENG
Other Authors: ELECTRICAL ENGINEERING
Format: Theses and Dissertations
Published: 2020
Online Access:https://scholarbank.nus.edu.sg/handle/10635/174688
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Institution: National University of Singapore
id sg-nus-scholar.10635-174688
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spelling sg-nus-scholar.10635-1746882020-11-19T13:57:15Z ELECTRICAL CHARACTERIZATION OF N2O ANNEALED GATE OXIDE DAI FENG ELECTRICAL ENGINEERING LING CHUNG HO Master's MASTER OF ENGINEERING 2020-09-08T08:51:12Z 2020-09-08T08:51:12Z 1998 Thesis DAI FENG (1998). ELECTRICAL CHARACTERIZATION OF N2O ANNEALED GATE OXIDE. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/174688 CCK BATCHLOAD 20200918
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description Master's
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
DAI FENG
format Theses and Dissertations
author DAI FENG
spellingShingle DAI FENG
ELECTRICAL CHARACTERIZATION OF N2O ANNEALED GATE OXIDE
author_sort DAI FENG
title ELECTRICAL CHARACTERIZATION OF N2O ANNEALED GATE OXIDE
title_short ELECTRICAL CHARACTERIZATION OF N2O ANNEALED GATE OXIDE
title_full ELECTRICAL CHARACTERIZATION OF N2O ANNEALED GATE OXIDE
title_fullStr ELECTRICAL CHARACTERIZATION OF N2O ANNEALED GATE OXIDE
title_full_unstemmed ELECTRICAL CHARACTERIZATION OF N2O ANNEALED GATE OXIDE
title_sort electrical characterization of n2o annealed gate oxide
publishDate 2020
url https://scholarbank.nus.edu.sg/handle/10635/174688
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