THE LATERAL PROFILING OF INTERFACE STATE AND OXIDE CHARGE DENSITIES IN ELECTRICALLY STRESSED MOSFET'S
Master's
Saved in:
Main Author: | |
---|---|
Other Authors: | |
Format: | Theses and Dissertations |
Published: |
2020
|
Online Access: | https://scholarbank.nus.edu.sg/handle/10635/174689 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
id |
sg-nus-scholar.10635-174689 |
---|---|
record_format |
dspace |
spelling |
sg-nus-scholar.10635-1746892024-10-27T00:51:40Z THE LATERAL PROFILING OF INTERFACE STATE AND OXIDE CHARGE DENSITIES IN ELECTRICALLY STRESSED MOSFET'S HOON SIEW KUOK ELECTRICAL ENGINEERING LING CHUNG HO Master's MASTER OF ENGINEERING 2020-09-08T08:51:15Z 2020-09-08T08:51:15Z 1998 Thesis HOON SIEW KUOK (1998). THE LATERAL PROFILING OF INTERFACE STATE AND OXIDE CHARGE DENSITIES IN ELECTRICALLY STRESSED MOSFET'S. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/174689 CCK BATCHLOAD 20200918 |
institution |
National University of Singapore |
building |
NUS Library |
continent |
Asia |
country |
Singapore Singapore |
content_provider |
NUS Library |
collection |
ScholarBank@NUS |
description |
Master's |
author2 |
ELECTRICAL ENGINEERING |
author_facet |
ELECTRICAL ENGINEERING HOON SIEW KUOK |
format |
Theses and Dissertations |
author |
HOON SIEW KUOK |
spellingShingle |
HOON SIEW KUOK THE LATERAL PROFILING OF INTERFACE STATE AND OXIDE CHARGE DENSITIES IN ELECTRICALLY STRESSED MOSFET'S |
author_sort |
HOON SIEW KUOK |
title |
THE LATERAL PROFILING OF INTERFACE STATE AND OXIDE CHARGE DENSITIES IN ELECTRICALLY STRESSED MOSFET'S |
title_short |
THE LATERAL PROFILING OF INTERFACE STATE AND OXIDE CHARGE DENSITIES IN ELECTRICALLY STRESSED MOSFET'S |
title_full |
THE LATERAL PROFILING OF INTERFACE STATE AND OXIDE CHARGE DENSITIES IN ELECTRICALLY STRESSED MOSFET'S |
title_fullStr |
THE LATERAL PROFILING OF INTERFACE STATE AND OXIDE CHARGE DENSITIES IN ELECTRICALLY STRESSED MOSFET'S |
title_full_unstemmed |
THE LATERAL PROFILING OF INTERFACE STATE AND OXIDE CHARGE DENSITIES IN ELECTRICALLY STRESSED MOSFET'S |
title_sort |
lateral profiling of interface state and oxide charge densities in electrically stressed mosfet's |
publishDate |
2020 |
url |
https://scholarbank.nus.edu.sg/handle/10635/174689 |
_version_ |
1821182545527570432 |