THE LATERAL PROFILING OF INTERFACE STATE AND OXIDE CHARGE DENSITIES IN ELECTRICALLY STRESSED MOSFET'S

Master's

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Bibliographic Details
Main Author: HOON SIEW KUOK
Other Authors: ELECTRICAL ENGINEERING
Format: Theses and Dissertations
Published: 2020
Online Access:https://scholarbank.nus.edu.sg/handle/10635/174689
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-1746892024-10-27T00:51:40Z THE LATERAL PROFILING OF INTERFACE STATE AND OXIDE CHARGE DENSITIES IN ELECTRICALLY STRESSED MOSFET'S HOON SIEW KUOK ELECTRICAL ENGINEERING LING CHUNG HO Master's MASTER OF ENGINEERING 2020-09-08T08:51:15Z 2020-09-08T08:51:15Z 1998 Thesis HOON SIEW KUOK (1998). THE LATERAL PROFILING OF INTERFACE STATE AND OXIDE CHARGE DENSITIES IN ELECTRICALLY STRESSED MOSFET'S. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/174689 CCK BATCHLOAD 20200918
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description Master's
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
HOON SIEW KUOK
format Theses and Dissertations
author HOON SIEW KUOK
spellingShingle HOON SIEW KUOK
THE LATERAL PROFILING OF INTERFACE STATE AND OXIDE CHARGE DENSITIES IN ELECTRICALLY STRESSED MOSFET'S
author_sort HOON SIEW KUOK
title THE LATERAL PROFILING OF INTERFACE STATE AND OXIDE CHARGE DENSITIES IN ELECTRICALLY STRESSED MOSFET'S
title_short THE LATERAL PROFILING OF INTERFACE STATE AND OXIDE CHARGE DENSITIES IN ELECTRICALLY STRESSED MOSFET'S
title_full THE LATERAL PROFILING OF INTERFACE STATE AND OXIDE CHARGE DENSITIES IN ELECTRICALLY STRESSED MOSFET'S
title_fullStr THE LATERAL PROFILING OF INTERFACE STATE AND OXIDE CHARGE DENSITIES IN ELECTRICALLY STRESSED MOSFET'S
title_full_unstemmed THE LATERAL PROFILING OF INTERFACE STATE AND OXIDE CHARGE DENSITIES IN ELECTRICALLY STRESSED MOSFET'S
title_sort lateral profiling of interface state and oxide charge densities in electrically stressed mosfet's
publishDate 2020
url https://scholarbank.nus.edu.sg/handle/10635/174689
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