Investigation of polysilicon passivated contact's resilience to potential-induced degradation

10.1016/j.solmat.2019.02.038

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Main Authors:	LUO WEI, CHEN NING, KE CANGMING, WANG YAN, ABERLE,ARMIN GERHARD, SEERAM RAMAKRISHNA, SHUBHAM DUTTAGUPTA, KHOO YONG SHENG
Other Authors:	ELECTRICAL AND COMPUTER ENGINEERING
Format:	Article
Language:	English
Published:	ELSEVIER SCIENCE BV 2020
Subjects:	Science & Technology Technology Physical Sciences Energy & Fuels Materials Science, Multidisciplinary Physics, Applied Materials Science Physics PV module reliability Potential-induced degradation (PID) Polysilicon-based passivated contact Surface polarization effect PID recovery PID solution SILICON SOLAR-CELLS PHOTOVOLTAIC MODULES EXPLANATION EMITTER
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/176841
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Institution:	National University of Singapore
Language:	English

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spelling	sg-nus-scholar.10635-1768412024-11-14T10:33:20Z Investigation of polysilicon passivated contact's resilience to potential-induced degradation LUO WEI CHEN NING KE CANGMING WANG YAN ABERLE,ARMIN GERHARD SEERAM RAMAKRISHNA SHUBHAM DUTTAGUPTA KHOO YONG SHENG ELECTRICAL AND COMPUTER ENGINEERING SOLAR ENERGY RESEARCH INST OF S'PORE MECHANICAL ENGINEERING Dr Wei Luo Science & Technology Technology Physical Sciences Energy & Fuels Materials Science, Multidisciplinary Physics, Applied Materials Science Physics PV module reliability Potential-induced degradation (PID) Polysilicon-based passivated contact Surface polarization effect PID recovery PID solution SILICON SOLAR-CELLS PHOTOVOLTAIC MODULES EXPLANATION EMITTER 10.1016/j.solmat.2019.02.038 SOLAR ENERGY MATERIALS AND SOLAR CELLS 195 168-173 2020-09-29T02:28:49Z 2020-09-29T02:28:49Z 2019-06-15 2020-09-28T14:25:52Z Article LUO WEI, CHEN NING, KE CANGMING, WANG YAN, ABERLE,ARMIN GERHARD, SEERAM RAMAKRISHNA, SHUBHAM DUTTAGUPTA, KHOO YONG SHENG (2019-06-15). Investigation of polysilicon passivated contact's resilience to potential-induced degradation. SOLAR ENERGY MATERIALS AND SOLAR CELLS 195 : 168-173. ScholarBank@NUS Repository. https://doi.org/10.1016/j.solmat.2019.02.038 0927-0248 1879-3398 https://scholarbank.nus.edu.sg/handle/10635/176841 en ELSEVIER SCIENCE BV Elements
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
language	English
topic	Science & Technology Technology Physical Sciences Energy & Fuels Materials Science, Multidisciplinary Physics, Applied Materials Science Physics PV module reliability Potential-induced degradation (PID) Polysilicon-based passivated contact Surface polarization effect PID recovery PID solution SILICON SOLAR-CELLS PHOTOVOLTAIC MODULES EXPLANATION EMITTER
spellingShingle	Science & Technology Technology Physical Sciences Energy & Fuels Materials Science, Multidisciplinary Physics, Applied Materials Science Physics PV module reliability Potential-induced degradation (PID) Polysilicon-based passivated contact Surface polarization effect PID recovery PID solution SILICON SOLAR-CELLS PHOTOVOLTAIC MODULES EXPLANATION EMITTER LUO WEI CHEN NING KE CANGMING WANG YAN ABERLE,ARMIN GERHARD SEERAM RAMAKRISHNA SHUBHAM DUTTAGUPTA KHOO YONG SHENG Investigation of polysilicon passivated contact's resilience to potential-induced degradation
description	10.1016/j.solmat.2019.02.038
author2	ELECTRICAL AND COMPUTER ENGINEERING
author_facet	ELECTRICAL AND COMPUTER ENGINEERING LUO WEI CHEN NING KE CANGMING WANG YAN ABERLE,ARMIN GERHARD SEERAM RAMAKRISHNA SHUBHAM DUTTAGUPTA KHOO YONG SHENG
format	Article
author	LUO WEI CHEN NING KE CANGMING WANG YAN ABERLE,ARMIN GERHARD SEERAM RAMAKRISHNA SHUBHAM DUTTAGUPTA KHOO YONG SHENG
author_sort	LUO WEI
title	Investigation of polysilicon passivated contact's resilience to potential-induced degradation
title_short	Investigation of polysilicon passivated contact's resilience to potential-induced degradation
title_full	Investigation of polysilicon passivated contact's resilience to potential-induced degradation
title_fullStr	Investigation of polysilicon passivated contact's resilience to potential-induced degradation
title_full_unstemmed	Investigation of polysilicon passivated contact's resilience to potential-induced degradation
title_sort	investigation of polysilicon passivated contact's resilience to potential-induced degradation
publisher	ELSEVIER SCIENCE BV
publishDate	2020
url	https://scholarbank.nus.edu.sg/handle/10635/176841
_version_	1821183448631476224

Investigation of polysilicon passivated contact's resilience to potential-induced degradation

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